參數(shù)資料
型號(hào)： MAX19713ETN
廠商： MAXIM INTEGRATED PRODUCTS INC
元件分類(lèi)： 通信及網(wǎng)絡(luò)
英文描述： 10-Bit, 45Msps, Full-Duplex Analog Front-End
中文描述： SPECIALTY TELECOM CIRCUIT, QCC56
封裝： 7 X 7 MM, 0.80 MM HEIGHT, MO-220, TQFN-56
文件頁(yè)數(shù)： 33/37頁(yè)
文件大?。?/td> 892K
代理商： MAX19713ETN
M
10-Bit, 45Msps, Full-Duplex
Analog Front-End
______________________________________________________________________________________
33
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes (ADC) and a monotonic transfer function
(ADC and DAC) (DAC Figure 14b).
ADC Offset Error
Ideally, the midscale transition occurs at 0.5 LSB above
midscale. The offset error is the amount of deviation
between the measured transition point and the ideal
transition point.
DAC Offset Error
Offset error (Figure 14a) is the difference between the
ideal and actual offset point. The offset point is the out-
put value when the digital input is midscale. This error
affects all codes by the same amount and usually can
be compensated by trimming.
ADC Gain Error
Ideally, the ADC full-scale transition occurs at 1.5 LSB
below full scale. The gain error is the amount of devia-
tion between the measured transition point and the
ideal transition point with the offset error removed.
ADC Dynamic Parameter Definitions
Aperture Jitter
Figure 15 shows the aperture jitter (t
AJ
), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (t
AD
) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 15).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error) and results directly
from the ADC’s resolution (N bits):
SNR(max) = 6.02 x N + 1.76 (in dB)
In reality, there are other noise sources besides quanti-
zation noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise. RMS noise includes all spec-
tral components to the Nyquist frequency excluding the
fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise and Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to the RMS noise. RMS noise includes all spectral
components to the Nyquist frequency excluding the
fundamental and the DC offset.
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
t
AD
t
AJ
TRACK
TRACK
CLK
Figure 15. T/H Aperture Timing
0
2
1
4
3
7
6
5
000
010
DIGITAL INPUT CODE
001
011
100
101
110
AT STEP
011 (0.5 LSB)
AT STEP
001 (0.25 LSB)
111
A
Figure 14a. Integral Nonlinearity
0
2
1
4
3
6
5
000
010
DIGITAL INPUT CODE
001
011
100
101
DIFFERENTIAL LINEARITY
ERROR (-0.25 LSB)
DIFFERENTIAL
LINEARITY ERROR (+0.25 LSB)
1 LSB
1 LSB
A
Figure 14b. Differential Nonlinearity
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MAX19713ETN+ 功能描述:ADC / DAC多通道 45Msps CODEC/AFE Full Duplex RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類(lèi)型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-40
MAX19713ETN+GH7 功能描述:ADC / DAC多通道 10-Bit 45Msps Full-Duplex Analog Front-End RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類(lèi)型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-40
MAX19713ETN+T 功能描述:ADC / DAC多通道 45Msps CODEC/AFE Full Duplex RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類(lèi)型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-40
MAX19713ETN+TGH7 功能描述:ADC / DAC多通道 10-Bit 45Msps Full-Duplex Analog Front-End RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類(lèi)型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-40
MAX19713ETN-T 功能描述:ADC / DAC多通道 RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類(lèi)型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-40
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