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參數(shù)資料
| 型號： | LTC1406 |
| 廠商： | Linear Technology Corporation |
| 英文描述： | Low Power, 8-Bit, 20Msps, Sampling A/D Converter(低功耗,12位, 20Msps,采樣模數(shù)轉(zhuǎn)換器) |
| 中文描述： | 低功耗，8位，20Msps，采樣A / D轉(zhuǎn)換器（低功耗，12位，20Msps，采樣模數(shù)轉(zhuǎn)換器） |
| 文件頁數(shù)： | 7/16頁 |
| 文件大?。?/td> | 367K |
| 代理商： | LTC1406 |
7
LTC1406
FU
CTIO
AL BLOCK DIAGRW
U
U
APPLICATIO
S I
N
FOR
ATIO
U
Conversion Details
The LTC1406 uses an internal sample-and-hold circuit and
a pipeline quantizing architecture to convert an analog
signal to an 8-bit parallel output. With CLK high the input
switches are closed and the analog input will be acquired
on the input sampling capacitors C
S
(see Figure 1).
On the falling edge of CLK the input switches open, captur-
ing the input signal. The sampling capacitors are then
shorted together and the charge is transferred to the hold
W
U
TRACK-AND-
HOLD AMP
DIGITAL
DATA
8-BIT
PIPELINE
ADC
2.5k
AV
DD
V
BIAS
V
REF
OV
DD
DV
DD
OGND
AGND
AGND
SHDN
1.95k
2.2V
OUTPUT
DRIVERS
OF/UF
D7
D6
D5
D4
D3
D2
D1
D0
1406 BD
CLOCK
CIRCUITRY
CLK
A
IN+
7
8
9
4
10
3
5
6
1
23
22
2
11
12
21
20
19
18
17
16
15
24
A
IN–
DGND
–
+
C
H
CLK
CLK
1406 F01
CLK
TO NEXT STAGE
CLK
CLK
A
IN+
A
IN–
C
H
C
S
C
S
CLK
Figure 1. Input Sample-and-Hold Amplifier
capacitors C
H
resulting in a differential DC voltage on the
output of the track-and-hold amplifier that is proportional
to the input signal. This differential voltage is fed into a
comparator that determines the most significant bit and
subtracts the result. The residue is then amplified by two
and passed to the next stage via a similar sample-and-hold
circuit. This continues down the eight pipeline stages. The
comparator outputs are then combined in a digital error
correction circuit. The 8-bit word is available at the output,
five clock cycles after the sampling edge.
Dynamic Performance
The LTC1406 has excellent wideband sampling capability.
The sample-and-hold amplifier has a small-signal input
bandwidth of 250MHz allowing the ADC to undersample
input signals with frequencies well beyond the converter’s
Nyquist frequency. FFT (Fast Fourier Transform) test tech-
niques are used to test the ADC’s frequency response,
distortion and noise at the rated throughput. By applying
a low distortion sine wave and analyzing the digital output
using an FFT algorithm, the ADC’s spectral content can be
examined for frequencies outside the fundamental. Figure
2 shows a typical LTC1406 FFT plot.
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