參數(shù)資料
型號(hào): KSZ8692XPB
廠商: Micrel Inc
文件頁(yè)數(shù): 30/42頁(yè)
文件大?。?/td> 0K
描述: IC ARM9 PHY 10/100MBPS 400-PBGA
標(biāo)準(zhǔn)包裝: 40
系列: KSZx692
應(yīng)用: 網(wǎng)絡(luò)和通信
核心處理器: ARM9
程序存儲(chǔ)器類型: 外部程序存儲(chǔ)器
控制器系列: KSZ
接口: EBI/EMI,以太網(wǎng),I²C,I²S,PCI,SPI,UART/USART,USB
輸入/輸出數(shù): 20
電源電壓: 1.235 V ~ 1.365 V
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 400-BGA
包裝: 托盤
供應(yīng)商設(shè)備封裝: 400-PBGA(24x24)
產(chǎn)品目錄頁(yè)面: 1080 (CN2011-ZH PDF)
其它名稱: 576-3537
Micrel, Inc.
KSZ8692MPB/KSZ8692XPB
March 2010
36
M9999-031810-4.0
Pin Number
Pin Name
Pin Type
Pin Description
T4
NWEN
Ipu/O
NAND Write Enable, asserted low
During reset, this pin is the input strap option for NAND Flash configuration
register (0x8054) bit [0]. This bit, along with configuration register bits [2:1], is
used for boot program. This pin, along with NCLE and NALE, is used to specify
NAND Flash size.
[NCLE, NALE, NWEN]
000 = 64Mbit
001 = 128Mbit (default)
010 = 256Mbit
011 = 512Mbit
100 = 1Gbit
101 = 2Gbit
110 = 4Gbit
111 = 8Gbit
U3
NWPN
Ipu/O
NAND Write Protection, asserted low
During reset, this pin is input strap option to enable test modes. This pin, along
with TESTEN, TESTEN1, form different test modes.
{TESTEN, TESTEN1, NWPN} =
011: ARM Scan test mode
010: USB Analog Bits test mode
others: refer to TESTEN and TESTEN1 pin description
(factory reserved)
G15
USBCFG
I
USB port 2 configuration
“1” = port 2 is host
“0” = port 2 is device
( port 1 is always host)
Test Pins Strapping Options
P5
SCANEN
Ipd
1 = Scan Enable (Factory reserved)
0 = Normal Operation
V2
TESTEN
Ipd
1 = Test Enable (Factory reserved)
0 = Normal Operation
V1
TESTEN1
Ipd
1 = Test Enable1 (Factory reserved)
0 = Normal Operation
Notes:
1. P = Power supply.
I = Input. O = Output.
O/I = Output in normal mode; input pin during reset.
Ipu = Internal 55k pull-up resistor.
Ipd = Internal 55k pull-down resistor.
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