參數(shù)資料
型號: ISPPAC81-01PI
廠商: LATTICE SEMICONDUCTOR CORP
元件分類: 模擬信號調(diào)理
英文描述: In-System Programmable Analog Circuit
中文描述: SPECIALTY ANALOG CIRCUIT, PDIP16
封裝: PLASTIC, DIP-16
文件頁數(shù): 16/20頁
文件大小: 176K
代理商: ISPPAC81-01PI
Lattice Semiconductor
ispPAC81 Data Sheet
16
TAP Controller Speci
fi
cs
The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether
an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a
small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as
shown in Figure 6. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO)
becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, Run-
Test/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But
there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a
reset of the test logic within
fi
ve TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on
default state.
Figure 6. Test Access Port (TAP) Controller State Diagram
When the correct logic sequence is applied to the TMS and TCK inputs, the TAP will exit the Test-Logic-Reset state
and move to the desired state. The next state after Test-Logic-Reset is Run-Test/Idle. Until a data or instruction
scan is performed, no action will occur in Run-Test/Idle (steady state = idle). After Run-Test/Idle, either a data or
instruction scan is performed. The states of the Data and Instruction Register blocks are identical to each other dif-
fering only in their entry points. When either block is entered, the
fi
rst action is a capture operation. For the Data
Registers, the Capture-DR state is very simple: it captures (parallel loads) data onto the selected serial data path
(previously chosen with the appropriate instruction). For the Instruction Register, the Capture-IR state will always
load the IDCODE instruction. It will always enable the ID Register for readout if no other instruction is loaded prior
to a Shift-DR operation. This, in conjunction with mandated bit codes, allows a “blind” interrogation of any device in
a compliant IEEE 1149.1 serial chain.
From the Capture state, the TAP transitions to either the Shift or Exit1 state. Normally the Shift state follows the
Capture state so that test data or status information can be shifted out or new data shifted in. Following the Shift
state, the TAP either returns to the Run-Test/Idle state via the Exit1 and Update states or enters the Pause state via
Exit1. The Pause state is used to temporarily suspend the shifting of data through either the Data or Instruction
Register while an external operation is performed. From the Pause state, shifting can resume by reentering the
Test-Logic-Rst
Run-Test/Idle
Select-DR-Scan
Select-IR-Scan
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
0
0
0
0
0
0
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
1
1
1
1
1
0
Note: The value shown adjacent to each state transition in this figure
represents the signal present at TMS at the time of a rising edge at TCK.
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