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| 型號： | ISPPAC30 |
| 廠商： | Lattice Semiconductor Corporation |
| 英文描述： | In-System Programmable Analog Circuit |
| 中文描述： | 在系統(tǒng)可編程模擬電路 |
| 文件頁數(shù)： | 26/30頁 |
| 文件大?。?/td> | 379K |
| 代理商： | ISPPAC30 |
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Lattice Semiconductor
ispPAC30 Preliminary Data Sheet
26
TAP Controller Speci
fi
cs
The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether
an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a
small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as
shown in Figure 10. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO)
becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, Run-
Test/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But
there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a
reset of the test logic within
fi
ve TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on
default state.
Figure 10. TAP States
When the correct logic sequence is applied to the TMS and TCK inputs, the TAP will exit the Test-Logic-Reset state
and move to the desired state. The next state after Test-Logic-Reset is Run-Test/Idle. Until a data or instruction shift
is performed, no action will occur in Run-Test/Idle (steady state = idle). After Run-Test/Idle, either a data or instruc-
tion shift is performed. The states of the Data and Instruction Register blocks are identical to each other differing
only in their entry points. When either block is entered, the
fi
rst action is a capture operation. For the Data Regis-
ters, the Capture-DR state is very simple: it captures (parallel loads) data onto the selected serial data path (previ-
ously chosen with the appropriate instruction). For the Instruction Register, the Capture-IR state will always load
the IDCODE instruction. It will always enable the ID Register for readout if no other instruction is loaded prior to a
Shift-DR operation. This, in conjunction with mandated bit codes, allows a “blind” interrogation of any device in a
compliant IEEE 1149.1 serial chain.
From the Capture state, the TAP transitions to either the Shift or Exit1 state. Normally the Shift state follows the
Capture state so that test data or status information can be shifted out or new data shifted in. Following the Shift
state, the TAP either returns to the Run-Test/Idle state via the Exit1 and Update states or enters the Pause state via
Exit1. The Pause state is used to temporarily suspend the shifting of data through either the Data or Instruction
Register while an external operation is performed. From the Pause state, shifting can resume by reentering the
Shift state via the Exit2 state or be terminated by entering the Run-Test/Idle state via the Exit2 and Update states.
If the proper instruction is shifted in during a Shift-IR operation, the next entry into Run-Test/Idle initiates the test
mode (steady state = test). This is when the device is actually programmed, erased or veri
fi
ed. All other instructions
are executed in the Update state.
Test-Logic-Rst
Run-Test/Idle
Select-DR-Scan
Select-IR-Scan
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
0
0
0
0
0
0
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
1
1
1
1
1
0
Note: The value shown adjacent to each state transition in this figure
represents the signal present at TMS at the time of a rising edge at TCK.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| ISPPAC30-01P | In-System Programmable Analog Circuit |
| ISPPAC30-01PI | In-System Programmable Analog Circuit |
| ISPPAC30-01S | In-System Programmable Analog Circuit |
| ISPPAC30-01SI | In-System Programmable Analog Circuit |
| ISPPAC80-01PI | In-System Programmable Analog Circuit |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ISPPAC30-01P | 制造商:LATTICE 制造商全稱:Lattice Semiconductor 功能描述:In-System Programmable Analog Circuit |
| ISPPAC30-01PI | 功能描述:SPLD - 簡單可編程邏輯器件 PROGRAMMABLE ANALOG CIRCUIT RoHS:否 制造商:Texas Instruments 邏輯系列:TICPAL22V10Z 大電池?cái)?shù)量:10 最大工作頻率:66 MHz 延遲時間:25 ns 工作電源電壓:4.75 V to 5.25 V 電源電流:100 uA 最大工作溫度:+ 75 C 最小工作溫度:0 C 安裝風(fēng)格:Through Hole 封裝 / 箱體:DIP-24 |
| ISPPAC30-01S | 制造商:LATTICE 制造商全稱:Lattice Semiconductor 功能描述:In-System Programmable Analog Circuit |
| ISPPAC30-01SI | 功能描述:SPLD - 簡單可編程邏輯器件 Not Upgrade Device CIRCUIT RoHS:否 制造商:Texas Instruments 邏輯系列:TICPAL22V10Z 大電池?cái)?shù)量:10 最大工作頻率:66 MHz 延遲時間:25 ns 工作電源電壓:4.75 V to 5.25 V 電源電流:100 uA 最大工作溫度:+ 75 C 最小工作溫度:0 C 安裝風(fēng)格:Through Hole 封裝 / 箱體:DIP-24 |
| ISPPAC80-01PI | 功能描述:SPLD - 簡單可編程邏輯器件 PROGRAMMABLE ANALOG CIRCUIT RoHS:否 制造商:Texas Instruments 邏輯系列:TICPAL22V10Z 大電池?cái)?shù)量:10 最大工作頻率:66 MHz 延遲時間:25 ns 工作電源電壓:4.75 V to 5.25 V 電源電流:100 uA 最大工作溫度:+ 75 C 最小工作溫度:0 C 安裝風(fēng)格:Through Hole 封裝 / 箱體:DIP-24 |
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