參數(shù)資料
型號: IGW03N120H2
廠商: INFINEON TECHNOLOGIES AG
英文描述: HighSpeed 2-Technology
中文描述: 高速2 -技術
文件頁數(shù): 7/13頁
文件大?。?/td> 397K
代理商: IGW03N120H2
IGP03N120H2,
IGW03N120H2
IGB03N120H2
Power Semiconductors
7
Rev. 2, Mar-04
E
,
S
0A
2A
4A
0.0mJ
0.5mJ
1.0mJ
E
on
1
E
off
E
ts
1
E
,
S
0
50
100
150
200
250
0.2mJ
0.3mJ
0.4mJ
0.5mJ
0.6mJ
0.7mJ
E
on
1
E
ts
1
E
off
I
C
,
COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load,
T
j
= 150
°
C,
V
CE
= 800V,
V
GE
= +15V/0V,
R
G
= 82
,
dynamic test circuit in Fig.E )
R
G
,
GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load,
T
j
= 150
°
C,
V
CE
= 800V,
V
GE
= +15V/0V,
I
C
= 3A,
dynamic test circuit in Fig.E )
E
,
S
25°C
80°C
125°C
150°C
0.1mJ
0.2mJ
0.3mJ
0.4mJ
0.5mJ
E
ts
1
E
on
1
E
off
E
o
,
T
U
O
S
E
L
0V/us
1000V/us
2000V/us
3000V/us
0.00mJ
0.04mJ
0.08mJ
0.12mJ
0.16mJ
I
C
=1A,
T
J
=150°C
I
C
=1A,
T
J
=25°C
I
C
=3A,
T
J
=150°C
I
C
=3A,
T
J
=25°C
T
j
,
JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction temperature
(inductive load,
V
CE
= 800V,
V
GE
= +15V/0V,
I
C
= 3A,
R
G
= 82
,
dynamic test circuit in Fig.E )
dv/dt
, VOLTAGE
SLOPE
Figure 16. Typical turn off switching energy
loss for soft switching
(
dynamic test circuit in Fig. E
)
1
)
E
on
and
E
ts
include losses
due to diode recovery.
1
)
E
and
E
include losses
due to diode recovery.
1
)
E
on
and
E
ts
include losses
due to diode recovery.
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