參數(shù)資料
型號： HY5PS12821F-4
廠商： Hynix Semiconductor Inc.
英文描述： 512Mb DDR2 SDRAM
中文描述： 512Mb DDR2 SDRAM芯片
文件頁數(shù)： 14/35頁
文件大?。?/td> 624K
代理商： HY5PS12821F-4
Rev. 1.0 / Feb. 2005
14
1
HY5PS12421(L)F
HY5PS12821(L)F
HY5PS121621(L)F
3.3 Output Buffer Characteristics
3.3.1 Output AC Test Conditions
3.3.2 Output DC Current Drive
3.3.3 OCD defalut characteristics
Note 1: Absolute Specifications (0°C
≤
T
CASE
≤
+tbd°C; VDD = +1.8V ±0.1V, VDDQ = +1.8V ±0.1V)
Note 2: Impedance measurement condition for output source dc current: VDDQ = 1.7V; VOUT = 1420mV;
(VOUT-VDDQ)/Ioh must be less than 23.4 ohms for values of VOUT between VDDQ and VDDQ-280mV.
Impedance measurement condition for output sink dc current: VDDQ = 1.7V; VOUT = 280mV; VOUT/Iol
must be less than 23.4 ohms for values of VOUT between 0V and 280mV.
Note 3: Mismatch is absolute value between pull-up and pull-dn, both are measured at same temperature and
voltage.
Note 4: Slew rate measured from vil(ac) to vih(ac).
Note 5: The absolute value of the slew rate as measured from DC to DC is equal to or greater than the slew
rate as measured from AC to AC. This is guaranteed by design and characterization.
Note 6: This represents the step size when the OCD is near 18 ohms at nominal conditions across all process
corners/variations and represents only the DRAM uncertainty. A 0 ohm value(no calibration) can only be
achieved if the OCD impedance is 18 ohms +/- 0.75 ohms under nominal conditions.
Symbol
Parameter
SSTL_18 Class II
Units
Notes
V
OTR
Output Timing Measurement Reference Level
0.5 * V
DDQ
V
1
1. The VDDQ of the device under test is referenced.
Symbol
Parameter
SSTl_18
Units
Notes
I
OH(dc)
Output Minimum Source DC Current
- 13.4
mA
1, 3, 4
I
OL(dc)
Output Minimum Sink DC Current
13.4
mA
2, 3, 4
1.
V
DDQ
= 1.7 V; V
OUT
= 1420 mV. (V
OUT
- V
DDQ
)/I
OH
must be less than 21 ohm for values of V
OUT
between V
DDQ
and V
DDQ
- 280
mV.
V
DDQ
= 1.7 V; V
OUT
= 280 mV. V
OUT
/I
OL
must be less than 21 ohm for values of V
OUT
between 0 V and 280 mV.
The dc value of V
REF
applied to the receiving device is set to V
TT
The values of I
OH(dc)
and I
OL(dc)
are based on the conditions given in Notes 1 and 2. They are used to test device drive current
capability to ensure V
IH
min plus a noise margin and V
IL
max minus a noise margin are delivered to an SSTL_18 receiver. The
actual current values are derived by shifting the desired driver operating point (see Section 3.3) along a 21 ohm load line to define
a convenient driver current for measurement.
2.
3.
4.
Description
Parameter
Min
Nom
Max
Unit
Notes
Output impedance
12.6
18
23.4
ohms
1,2
Output impedance step size for OCD cali-
bration
0
1.5
ohms
6
Pull-up and pull-down mismatch
0
4
ohms
1,2,3
Output slew rate
Sout
1.5
-
5
V/ns
1,4,5,6,7,8
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