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| 型號(hào)： | GR500 |
| 廠商： | KEMET Corporation |
| 英文描述： | HIGH RELIABILITY SOLID TANTALUM |
| 中文描述： | 高可靠性固體鉭 |
| 文件頁數(shù)： | 20/24頁 |
| 文件大?。?/td> | 686K |
| 代理商： | GR500 |
GR500 GRADED RELIABILITY SPECIFICATIONS
KEMET Electronics Corporation P.O. Box 5928 Greenville, S.C. 29606 864/963-6300
20
KEMET
c) Applied voltage during shock—dc rated voltage.
d) Monitoring during shock—electrical discontinuities of
500 microseconds or greater duration.
e) Visual examination after test—no indication of
mechanical damage arcing or breakdown.
4.5.10
Vibration (see 3.5.11)
—Capacitors shall be tested as
specified in MIL-STD-202. Method 204. The following
details apply:
a) Test condition letter—D (20 g)
b) Mounting—Capacitor bodies shall be rigidly mounted
and leads attached to supported terminals. Lead length
between capacitor body and supporting terminals shall
be approximately
3
/
8
inch.
c) Applied voltage during vibration—dc rated voltage.
d) Monitoring during last cycle—electrical discontinuities
of 500 microseconds or greater duration
e) Visual examination after test—no indication of mechan-
ical damage, arcing, or breakdown.
4.5.11
Thermal shock and immersion (see 3.5.13).
4.5.11.1
Thermal shock
—Capacitors shall be tested as
specified in MIL-STD-2t)2, Method 107. The following
details apply:
a) Test condition letter—B (Except. # cycles = 10)
b) Measurements before and after test—not applicable.
4.5.11.2
Immersion
—Capacitors shall be tested as specified
in MIL-STD-202, Method 104. The following details apply:
a) Test condition letter—B
b) Measurements after tests dc leakage, capacitance and
dissipation factor (see 4.5.4, 4.5.5, 4.5.6) shall be as
specified in detailed specification within 4 hours after
removal from the final immersion bath.
c) Visual examination after test
4.5.12
Solderability (see 3.5.13)
—Capacitors shall be
tested as specified in MIL-STD-202. Method 208. The fol-
lowing details apply:
a) Number of leads tested-2
b) Depth of immersion in flux and solder within
1
/
8
inch of
case, tubulation or seal.
4.5.13
Terminal strength (see 3.5.14)
4.5.13.1
Pull
—Capacitors shall be tested as specified in
MIL-STD-202, Method 211. The following details apply:
a) Test condition letter—A
b) The body of the capacitor shall be secured.
c) Applied force—3 pounds.
4.5.13.2
Twist
—Capacitors shall he tested as specified in
MIL-STD-202, Method 211. The following details apply:
a) Test condition letter—D
b) Rotations—3
4.5.14
Moisture resistance (see 3.5.15)
—Capacitors shall
be tested as specified in MIL-STD-202, Method 106 (less
Step 7b). The following details apply:
a) Applied voltage—none
b) Measurement after test—dc leakage, capacitance and
dissipation factor (see 4.5.4, 4.5.5 and 4.5.6) shall be
measured within 2 to 6 hours after removal from the
humidity chamber.
c) Visual examination after test—no indication of deleteri-
ous corrosion.
4.5.15
Case insulation (see 3.5.16)
4.5.15.1
Case insulation dielectric strength
—Capacitors
shall be placed in a V-block. A dc potential of 2000 volts
(applied at the rate of 500 volts/second) shall be applied
between the V-block and capacitor case for a period 1
minute ±5 seconds. A maximum leakage current of 20
microamps will be allowed.
4.5.15.2
Case insulation resistance
—Capacitors shall be
placed in a V-block as specified in 4.5.16.1. The insulation
resistance shall be measured with a polarizing voltage of 500
±50 volts dc for 1 minute +0,-15 seconds. The capacitor
shall be moved in the block and the measurement repeated
five times.
4.5.16
Temperature stability (see 3.5.17)
—DC leakage,
capacitance, and dissipation factor (see 4.5.4, 4.5.5, and
4.5.6) shall be measured at the temperatures specified in
Table 5, except that the dc leakage measurements at -55°C
(step 2) are not required. However, after the measurements
of capacitance and dissipation factor have been made at the
-55°C temperature (step 2), rated voltage shall be applied for
a minimum of 5 minutes. The capacitors shall be stabilized
at each temperature. Thermal stability shall be considered
acceptable when
C =
≥
0.2% between two successive mea-
surements taken at 15 minute intervals.
TABLE 5 — Temperature Stability Test Conditions
Step
Test Temperature (°C)
1
+25(±2)
2
-55(+0, -3)
3
+25(±2)
Limits
Per tables
Cap ±10% DF per tables
DC leakage, DF per tables,
Cap ±2%
Cap + 8% DC leakage,
DF per table
Cap ±12% DC leakage,
DF per table
Cap ±2% DC leakage.
DF per table
4
+85(+4, -0)
5
+125(+4, -0)
6
+25(±2)
4.5.17
Surge Current
—Capacitors shall be subjected to 10
consecutive cycles of surge current at -55°C, +85°C. Rated
voltage ±2% shall be applied for 4 ± 1 seconds, the capaci-
GR500 GRADED RELIABILITY SPECIFICATION (Continued)
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