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| 型號： | GR500 |
| 廠商： | KEMET Corporation |
| 英文描述： | HIGH RELIABILITY SOLID TANTALUM |
| 中文描述： | 高可靠性固體鉭 |
| 文件頁數(shù)： | 18/24頁 |
| 文件大小： | 686K |
| 代理商： | GR500 |
4.4.1.1
Group A
—Group Ashall consist of those tests listed
in Table 2.
4.4.1.2
Group C
—Group C shall consist of those tests listed
in Table 3.
4.4.1.2.1
Sampling Plan
—Group C shall be performed
every three months. The sample shall consist of 48 pieces,
selected at random from the largest and smallest case sizes
produced during the month in the approximately ratio of
production.
TABLE 2 — Group A Inspection
Paragraph References
Requirement
Number of
pieces tested
Failures
Allowed
Test
Subgroup 1
Thermal shock
Surge current
Grading (Accelerated
voltage aging
DC Leakage
Capacitance
Dissipation Factor
ESR
Seal
Radiographic
inspection
Method
3.5.1
3.5.1.9
4.5.2
4.5.18
3.5.2
3.5.3
3.5.4
3.5.5
3.5.6
3.5.7
4.5.3
4.5.4
4.5.5
4.5.6
4.5.17
4.5.7
Not
appli-
cable
100%
3.5.8
4.5.8
Subgroup 2
Visual & mechanical
inspection
3.5.9
4.5.1
Subgroup 3
Solderability
Temperature stability
3.5.13
3.5.17
4.5.12
4.5.16
13
20
0
0
Per Production Lot of a single capacitance value, case size and voltage.
TABLE 3 — Group C Inspection
Paragraph References
Requirement
Number of
pieces tested
Failures
Allowed
Test
Subgroup 1
Shock
Vibration
Thermal shock
and immersion
Method
3.5.10
3.5.11
4.5.9
4.5.10
12
3.5.12
4.5.11
1
Subgroup 2
Terminal strength
Resistance to solvents
Resistance to
soldering heat
Moisture resistance
Sleeving
3.5.14
3.5.20
4.5.13
4.5.19
12
3.5.21
3.5.15
3.5.16
4.5.20
4.5.14
4.5.15
Subgroup 3
Life (at 125°C)
3.5.19
4.5.18
24
4.4.1.2.2
Nonconformance
—Failures in excess of those
allowed during Group C testing shall be cause to discontinue
acceptance of product. Corrective action sha1l be instituted
and the product retested. Evidence of successful corrective
action shall release the product for acceptance.
4.5
Test procedures
GR500 GRADED RELIABILITY SPECIFICATIONS
KEMET Electronics Corporation P.O. Box 5928 Greenville, S.C. 29606 864/963-6300
18
KEMET
3.8
Workmanship
—Capacitors shall be processed in such a
manner as to be uniform in quality and shall be free from cold
soldering, corrosion, pits, cracks, dents, rough edges, and
other defects that will affect life, serviceability, or appear-
ance. Solder on the surface of the case shall be smooth and
unbroken and shall not have any pin holes or girdle.
3.9
Data submittal
—Each shipment shall be accompanied
by the following data for the respective lots (see paragraph
3.5.2 and 4.5.3).
a)Weibull distribution plot
b)Failure rate computation sheet
In addition, a statement of compliance to this specification
shall accompany each shipment.
3.10
Deviations
—Special or non-standard configurations,
designs, finishes, or test requirements requiring deviation to
this specification or the applicable detail specification shall
be subject to negotiation between the procuring agency and
the manufacturer.
4. QUALITY ASSURANCE PROVISIONS
4.1
Responsibility for inspection
—The manufacturer is
responsible for the performance of all inspection require-
ments as specified herein.
4.1.2
Reliability assurance program
—The manufacturer
is responsible for establishing a reliability assurance pro-
gram complying with the requirements of MIL-STD-790.
4.1.3
Additional inspection
—Nothing specified herein
shall preclude the manufacturer from making additional or
more stringent inspection as he may deem necessary or
desirable to assure conformance with the requirements of
this specification.
4.2
Classification of testing and inspection
—The testing
and inspection of capacitors shall be classified as follows:
a) Acceptance inspection (see 4.4)
4.3
General test requirements
4.3.1
Inspection conditions
—Unless otherwise specified,
all inspection shall be made at 25°C +5°C ambient atmos-
pheric pressure and humidity.
4.3.2
Test equipment and inspection facilities
—Test
equipment and inspection facilities shall be of sufficient
accuracy and quality to permit performance of the required
inspection. The manufacturer shall establish calibration of
inspection equipment to the satisfaction of the user but at a
minimum must meet the requirements of MIL-STD-45662.
4.4
Acceptance inspection
4.4.1
Acceptance tests
—Acceptance tests shall consist of
Group A. Capacitors shall be subjected to Group A
(Subgroups 1, 2, 3), and C. Testing in accordance with
Group C shall be considered degrading and product so tested
shall not be shipped.
GR500 GRADED RELIABILITY SPECIFICATION (Continued)
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