- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄383013 > GR500 (KEMET Corporation) HIGH RELIABILITY SOLID TANTALUM PDF資料下載
參數(shù)資料
| 型號： | GR500 |
| 廠商： | KEMET Corporation |
| 英文描述： | HIGH RELIABILITY SOLID TANTALUM |
| 中文描述： | 高可靠性固體鉭 |
| 文件頁數(shù)： | 19/24頁 |
| 文件大小： | 686K |
| 代理商： | GR500 |
TABLE 4 — Acceleration Factors
RATIO OF APPLIED
VOLT. TO RATED
VOLT. AT 85°C
ACCELERATION
FACTOR
1.0000
1.1000
1.2000
1.3000
1.4000
1.5000
1.5276
1.0000
6.5355
42.7128
279.1496
1,824.3823
11,923.2626
20,000.0000
4.5.4
DC leakage (see 3.5.3)
—Leakage current shall be
measured after applying the dc rated voltage for a maximum
electrification period of 5 minutes. A 1K ohm resistor shall
be placed in series with the capacitor to limit the charging
current. A steady source of power such as a regulated power
supply shall be used. Measurement accuracy shall be within
±2 per cent or .02 microamp, whichever is greater.
4.5.5
Capacitance (see 3.5.4)
—Capacitance shall be mea-
sured as specified in MIL-STD-202, Method 305. The fol-
lowing details apply:
a) Test frequency— 120 ±5 Hertz
b) Limit of accuracy— ±2% of reading
c) Max. ac voltage—1.0V rms
d) Max. dc bias—2.2V
4.5.6
Dissipation factor (see 3.5.5)
—Dissipation factor
shall be measured on a capacitance bridge or on other appro-
priate equipment. The following details apply:
a) Test conditions-per 4.5.5 (details a, c, and d)
b) Limit of accuracy-dial reading accuracy of 0.1% dissipa-
tion factor and measuring accuracy of ±2% of measured
value plus 0.1%.
4.5.7
Seal Tests (see 3.5.7)
—GR500 Product receives 100%
hermeticity test per MIL-STD-202. Method 112, Condition D.
4.5.8
Radiographic inspection (see 3.5.8)
—Capacitors
shall be x-rayed in two (2) planes perpendicular to their lon-
gitudinal axis. The equipment shall utilize image quality
indicators (ASTM Type B) to assure that radiograms are of
sufficient resolution and contrast to detect the conditions
described in 3.5.8. Non-conforming devices shall be
removed from the lot.
4.5.9
Shock (see 3.5.10)
—Capacitors shall be tested as
specified in MIL-STD-202, Method 213. The following
details apply:
a) Test condition letter—1 (l00g peak).
b) Mounting—Capacitor bodies shall be rigidly mounted
and leads attached to well supported terminals.
GR500 GRADED RELIABILITY SPECIFICATIONS
KEMET Electronics Corporation P.O. Box 5928 Greenville, S.C. 29606 864/963-6300
19
KEMET
4.5.1
Visual and mechanical examination
—Examination
of capacitors shal1 verify compliance with the requirements
of materials, design, construction, physical dimensions. mark-
ing, and workmanship as listed in 3.1,3.3,3.4,3.6, and 3.8.
4.5.2
Thermal shock (See 3.5.1)
—Capacitors sha1l be sub-
jected to the thermal shock tests as specified in MIL-STD-
202, Method 107. The following details shall apply:
(a) Special mounting-Not applicable.
(b) Test condition letter-B. (Except, # cycles = 10)
(c) Measurements before and after test-Not applicable.
4.5.3
Grading (see 3.5.2)
4.5.3.1
Aging conditions
—Capacitors shall be power aged
at 85°C for a minimum of 250 hours at a voltage greater than
rated voltage (see Table 4). The aging circuit shall have less
than one (1) ohms total impedance exclusive of the capaci-
tors under test. Each capacitor shall be individually fused
with a one (1) ampere fast-blow fuse.
4.5.3.1.1
Definition of failure
—For purposes of data col-
lection (see 4.5.3.2), a failure shall be defined as a blown
fuse and shall be considered catastrophic.
4.5.3.2
Data collection
—The elapsed time to catastrophic
failures shall be recorded. The number of failures shall be
recorded and calculated as a cumulative percentage of the
original lot size. After data has been recorded for a minimum
period of 40 hours, cumulative percentage versus failure age
shall be plotted of Weibull probability paper. The Weibull
scale (s) and shape (s) parameter shall then be determined
(see Figures 1 and 2). The failure rate at 1 hour and the
required aging time to meet the failure rate goal shall be
computed. Upon completion of the required aging time, the
additional data shall be plotted and failure rate confirmed.
Z(t) = Z(Ax) = x -1 l0
5
α
A
where: Z(t) = The desired instantaneous failure rate in per
cent per 1000 hours at 5 equivalent hours at
rated conditions.
x = actual test hours.
A= acceleration factor.
= Weibull shape parameter.
α
= Weibull scale parameter.
The minimum test time employed will be 250 hours. how-
ever, this shall be increased, in consideration of the lot per-
formance, to achieve the failure rate goal. Figures 1, 2, and
3 are typical examples of computation chart. Weibull plot
and failure rate plot respectively.
GR500 GRADED RELIABILITY SPECIFICATION (Continued)
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| GRF180 | SURFACE MOUNT, MAGNETIC-LATCHING BROADBAND RF RELAYS DPDT |
| GRM1885C1H101JA01 | Monolithic Ceramic Capacitors |
| GRM219E41H104MA01 | Monolithic Ceramic Capacitors |
| GRM219E41H104MA010.10uF | Monolithic Ceramic Capacitors |
| GRM219E41H104MA010805 | Monolithic Ceramic Capacitors |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| GR500AE05-03C | 制造商: 功能描述: |
| GR500AJ05-05C | 制造商: 功能描述: 制造商:undefined 功能描述: |
| GR500AJ05-06B | 制造商: 功能描述: 制造商:undefined 功能描述: |
| GR500AJ0507B | 制造商: 功能描述: 制造商:undefined 功能描述: |
| GR500AJ06-04B | 制造商: 功能描述: |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。