
DS26522 Dual T1/E1/J1 Transceiver 
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13.2 Instruction Register 
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length. When the 
TAP controller enters the Shift-IR state, the instruction shift register will be connected between JTDI and JTDO. 
While in the Shift-IR state, a rising edge on JTCLK with JTMS LOW will shift the data one stage towards the serial 
output at JTDO. A rising edge on JTCLK in the Exit1-IR state or the Exit2-IR state with JTMS HIGH will move the 
controller to the Update-IR state. The falling edge of that same JTCLK will latch the data in the instruction shift 
register to the instruction parallel output. Instructions supported by the DS26522 and its respective operational 
binary codes are shown in 
Table 13-1
. 
Table 13-1. Instruction Codes for IEEE 1149.1 Architecture 
INSTRUCTION 
SAMPLE:PRELOAD 
BYPASS 
EXTEST 
CLAMP 
HIGHZ 
IDCODE 
SELECTED REGISTER 
Boundary Scan 
Bypass 
Boundary Scan 
Bypass 
Bypass 
Device Identification 
INSTRUCTION CODES 
010 
111 
000 
011 
100 
001 
13.2.1 SAMPLE:PRELOAD 
This is a mandatory instruction for the IEEE 1149.1 specification. This instruction supports two functions. The 
digital I/Os of the device can be sampled at the boundary scan register without interfering with the normal operation 
of the device by using the Capture-DR state. SAMPLE:PRELOAD also allows the device to shift data into the 
boundary scan register via JTDI using the Shift-DR state. 
13.2.2 BYPASS 
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO through the 
one-bit bypass test register. This allows data to pass from JTDI to JTDO without affecting the device’s normal 
operation. 
13.2.3 EXTEST 
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the instruction 
register, the following actions occur. Once enabled via the Update-IR state, the parallel outputs of all digital output 
pins will be driven. The boundary scan register will be connected between JTDI and JTDO. The Capture-DR will 
sample all digital inputs into the boundary scan register. 
13.2.4 CLAMP 
All digital outputs of the device will output data from the boundary scan parallel output while connecting the bypass 
register between JTDI and JTDO. The outputs will not change during the CLAMP instruction. 
13.2.5 HIGHZ 
All digital outputs of the device will be placed in a high-impedance state. The BYPASS register will be connected 
between JTDI and JTDO. 
13.2.6 IDCODE 
When the IDCODE instruction is latched into the parallel instruction register, the identification test register is 
selected. The device identification code will be loaded into the identification register on the rising edge of JTCLK 
following entry into the Capture-DR state. Shift-DR can be used to shift the identification code out serially via 
JTDO. During Test-Logic-Reset, the identification code is forced into the instruction register’s parallel output. The 
ID code will always have a 1 in the LSB position. The next 11 bits identify the manufacturer’s JEDEC number and 
number of continuation bytes followed by 16 bits for the device and 4 bits for the version.