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參數(shù)資料
| 型號： | CD40101BMS |
| 廠商： | Intersil Corporation |
| 英文描述： | CMOS 9-Bit Parity Generator/Checker(抗輻射9位奇偶發(fā)生器校驗(yàn)器) |
| 中文描述： | 的CMOS 9位奇偶發(fā)生器/檢查（抗輻射9位奇偶發(fā)生器校驗(yàn)器） |
| 文件頁數(shù)： | 5/8頁 |
| 文件大小： | 105K |
| 代理商： | CD40101BMS |
7-1290
Specifications CD40101BMS
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
±
-0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 1
Note 1
6, 9
1-5, 7, 8, 10-13
14
Static Burn-In 2
Note 1
6, 9
7
1-5, 8, 10-14
Dynamic Burn-
In Note 1
-
4, 7
12, 14
6, 9
2, 3, 5, 8, 10
1, 11, 13
Irradiation
Note 2
6, 9
7
1-5, 8, 10-14
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
±
0.5V
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
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