參數(shù)資料
型號(hào): CB45000
廠商: 意法半導(dǎo)體
英文描述: HCMOS6 STANDARD CELLS
中文描述: HCMOS6標(biāo)準(zhǔn)單元
文件頁(yè)數(shù): 8/16頁(yè)
文件大?。?/td> 265K
代理商: CB45000
CB45000 SERIES
8/16
which are true LSSD cells. Non-overlapping clock
generator macros are also available.
For parametric and Iddq testing, the I/O cells
contain a dedicated test interface as described
previously (See “I/O TEST INTERFACE” on
page 6.)
EVALUATION DEVICE
An evaluation device is used to demonstrate the
performance of the CB45000 series as well as
verify the effectiveness of the design system. The
device has path delays, latches and a set of
macrocells and memory functions which were
used to verify the simulated characteristics that
are supplied in the data book. Characterization of
the path delays including interconnect shows
typical delays of 160 ps for a 2 input NAND with
receivers/drivers operating at frequencies of 200
MHz. The evaluation device is available in a 208
pin plastic quad flat pack.
Figure 5
Evaluation Device Cross Section
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