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參數(shù)資料
型號(hào)： ADATE305BSVZ
廠商： Analog Devices Inc
文件頁數(shù)： 11/56頁
文件大小： 0K
描述： IC DCL ATE 250MHZ DUAL 100TQFP
標(biāo)準(zhǔn)包裝： 1
類型： DCL
應(yīng)用： 自動(dòng)測試設(shè)備
安裝類型： 表面貼裝
封裝/外殼： 100-TQFP 裸露焊盤
供應(yīng)商設(shè)備封裝： 100-TQFP-EP（14x14）
包裝： 托盤
ADATE305
Rev. 0 | Page 19 of 56
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 14.
Parameter
Rating
Supply Voltages
Positive Supply Voltage (VDD to GND)
0.5 V to +11.0 V
Positive VCC Supply Voltage (VCC to GND)
0.5 V to +4.0 V
Negative Supply Voltage (VSS to GND)
6.25 V to +0.5 V
Supply Voltage Difference (VDD to VSS)
1.0 V to +16.5 V
Reference Ground (DUTGND to GND)
0.5 V to +0.5 V
AGND to DGND
0.5 V to +0.5 V
VPLUS Supply Voltage (VPLUS to GND)
0.5 V to +17.5 V
Input Voltages
Input Common-Mode Voltage
VSS to VDD
Short-Circuit Voltage1
3.0 V to +8.0 V
High Speed Input Voltage2
0.0 V to VCC
High Speed Differential Input Voltage3
0.0 V to VCC
VREF
0.5 V to +5.5 V
DUTx I/O Pin Current
DCL Maximum Short-Circuit Current4
±140 mA
Temperature
Operating Temperature, Junction
125°C
Storage Temperature Range
65°C to +150°C
For liquid cooled applications, θJC = 1.1°C/W.
Table 15. Thermal Resistance
Airflow
θJA
Unit
Natural Convection
33
°C/W
1 meter per second
30
°C/W
2 meters per second
28.5
°C/W
EXPLANATION OF TEST LEVELS
D
Definition
S
Design verification simulation
P
100% production tested
PF
Functionally checked during production test
CT
Characterized on tester
CB
Characterized on bench
ESD CAUTION
1 RL = 0 Ω, VDUT continuous short-circuit condition, (VH, VL, VT, high-Z, VCOM,
clamp modes).
2 DATAxP, DATAxN, RCVxP, RCVxN, under source R = 0 Ω.
3 DATAxP to DATAxN, RCVxP, RCVxN.
4 RL = 0 Ω, VDUTx = –3 V to +8 V; DCL current limit. Continuous short-circuit
condition. ADATE305 must current limit and survive continuous short circuit.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
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