參數(shù)資料
型號: AD5762RCSUZ-REEL7
廠商: Analog Devices Inc
文件頁數(shù): 11/32頁
文件大?。?/td> 0K
描述: IC DAC 16BIT QUAD VOUT 32-TQFP
產(chǎn)品培訓模塊: Data Converter Fundamentals
DAC Architectures
產(chǎn)品變化通告: AD5762R Metal Layer Edit Change 07/Sept/2009
標準包裝: 500
設置時間: 8µs
位數(shù): 16
數(shù)據(jù)接口: 串行
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 模擬和數(shù)字,雙 ±
功率耗散(最大): 180mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 32-TQFP
供應商設備封裝: 32-TQFP(7x7)
包裝: 帶卷 (TR)
輸出數(shù)目和類型: 2 電壓,雙極
采樣率(每秒): 84.6k
Data Sheet
AD5762R
Rev. C | Page 19 of 32
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, a measure of the maximum deviation, in LSBs,
from a straight line passing through the endpoints of the DAC
transfer function.
Differential Nonlinearity (DNL)
The difference between the measured change and the ideal 1 LSB
change between any two adjacent codes. A specified differential
nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC
is guaranteed monotonic.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5744R is
monotonic over its full operating temperature range.
Bipolar Zero Error
The deviation of the analog output from the ideal half-scale
output of 0 V when the DAC register is loaded with 0x8000
(offset binary coding) or 0x0000 (twos complement coding).
Figure 22 shows a plot of bipolar zero error vs. temperature.
Bipolar Zero Temperature Coefficient
The measure of the change in the bipolar zero error with a
change in temperature. It is expressed as parts per million of
full-scale range per degree Celsius (ppm FSR/°C).
Full-Scale Error
The measure of the output error when full-scale code is loaded
to the DAC register. Ideally, the output voltage should be 2 ×
VREFIN 1 LSB. Full-scale error is expressed as a percentage of
full-scale range (% FSR).
Negative Full-Scale Error/Zero-Scale Error
The error in the DAC output voltage when 0x0000 (offset binary
coding) or 0x8000 (twos complement coding) is loaded to the
DAC register. Ideally, the output voltage should be 2 × VREFIN.
Figure 21 shows a plot of zero-scale error vs. temperature.
Output Voltage Settling Time
The amount of time it takes for the output to settle to a specified
level for a full-scale input change.
Slew Rate
A limitation in the rate of change of the output voltage. The
output slewing speed of a voltage-output DAC is usually limited
by the slew rate of the amplifier used at its output. Slew rate is
measured from 10% to 90% of the output signal and is given in
volts per microsecond (V/μs).
Gain Error
A measure of the span error of the DAC. It is the deviation in
slope of the DAC transfer characteristic from the ideal, expressed
as a percentage of the full-scale range (% FSR). Figure 23 shows
a plot of gain error vs. temperature.
Total Unadjusted Error (TUE)
A measure of the output error, considering all the various
errors. Figure 19 shows a plot of total unadjusted error vs.
reference voltage.
Zero-Scale Error Temperature Coefficient
A measure of the change in zero-scale error with a change in
temperature. It is expressed as parts per million of full-scale
range per degree Celsius (ppm FSR/°C).
Gain Error Temperature Coefficient
A measure of the change in gain error with changes in tempera-
ture. It is expressed as parts per million of full-scale range per
degree Celsius (ppm FSR/°C).
Digital-to-Analog Glitch Energy
The impulse injected into the analog output when the input
code in the DAC register changes state. It is normally specified
as the area of the glitch in nanovolt-seconds (nV-sec) and is
measured when the digital input code is changed by 1 LSB at the
major carry transition (0x7FFF to 0x8000), as seen in Figure 28.
Digital Feedthrough
A measure of the impulse injected into the analog output of the
DAC from the digital inputs of the DAC but is measured when
the DAC output is not updated. It is specified in nanovolt-seconds
(nV-sec) and measured with a full-scale code change on the
data bus, that is, from all 0s to all 1s, and vice versa.
Power Supply Sensitivity
Indicates how the output of the DAC is affected by changes in
the power supply voltage.
DC Crosstalk
The dc change in the output level of one DAC in response to a
change in the output of another DAC. It is measured with a full-
scale output change on one DAC while monitoring another
DAC, and is expressed in least significant bits (LSBs).
DAC-to-DAC Crosstalk
The glitch impulse transferred to the output of one DAC due to
a digital code change and subsequent output change of another
DAC. This includes both digital and analog crosstalk. It is
measured by loading one of the DACs with a full-scale code
change (from all 0s to all 1s, and vice versa) with LDAC low and
monitoring the output of another DAC. The energy of the glitch
is expressed in nanovolt-seconds (nV-sec).
Channel-to-Channel Isolation
The ratio of the amplitude of the signal at the output of one DAC
to a sine wave on the reference input of another DAC. It is
measured in decibels (dB).
Reference Temperature Coefficient
A measure of the change in the reference output voltage with
a change in temperature. It is expressed in parts per million per
degree Celsius (ppm/°C).
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