參數(shù)資料
型號: 73S1217F-EB
廠商: Maxim Integrated Products
文件頁數(shù): 91/93頁
文件大小: 0K
描述: BOARD EVAL 73S1217F CBL/DOC/CD
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 1
系列: *
UG_12xxF_016
73S12xxF Software User Guide
Rev. 1.50
91
4.5.2
VISA-2 Loopback Test
Teridian used the ICT-K test lab in Korea (listed on the www.emvco.com website) for VISA-2 loopback
testing. This lab used the VISA test suite version 4.1 for their EMV Level I qualification test services
(details shown in Figure 15). The USB CCID firmware includes the source code that implements this
test.
Initialization
Enter Delay Time
(in Secs)
Power-Up Ok
(Good ATR)?
SELECT FILE
1PAY.SYS.DDF01
EMV Power
Down
M/m
Any other Key
Warm Reset OK?
Yes
No
Exchange OK?
End of Record?
or No Record?
Enter (M/m) Multi-
or (anykey) Single
Shot?
Delay Time Wait
EMV Power Up
Negotiable Mode?
No
PPS OK?
Yes
SingleShot?
Yes
No
Yes
No
Yes
READ RECORD
(00 B2 'P1' 0C 00)
Yes
P1 = 01
Increment RECORD
Index (P1)
Yes
No
Exchange OK?
No
T-AID Present
T-Select AID Command
Yes
Exchange OK?
No
Yes
No
T-Book1 - 12.4 Step 1
T - 00A404000CA00000000310100000000001
Figure 15: VISA-2 Loopback Test Flow Chart
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