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參數(shù)資料
| 型號(hào)： | XRT7234 |
| 廠商： | Exar Corporation |
| 英文描述： | E3 ATM User Network Interface(E3異步傳輸模式用戶(hù)網(wǎng)絡(luò)接口) |
| 中文描述： | E3展自動(dòng)柜員機(jī)用戶(hù)網(wǎng)絡(luò)接口（E3展異步傳輸模式用戶(hù)網(wǎng)絡(luò)接口） |
| 文件頁(yè)數(shù)： | 49/318頁(yè) |
| 文件大?。?/td> | 2088K |
| 代理商： | XRT7234 |
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x r
PRELIMINAZRY
E3 UNI FOR ATM
XRT7234
REV. P1.0.0
55
3.3.2.7 Test Cell Control and Status Register
Bit 4—Test Cell (Generator/Receiver) Enable
This “Read/Write” bit-field allows the user to perform some testing on the UNI, by activating the “Test and Diagnostic”
section. Once the user has activated this section, then the “internal” Test Cell Generator and Test Cell Receiver will
be active. The Test Cell Generator will generate cells in accordance with a “traffic pattern” as dictated by the user in
his/her selection within the “One Shot Test” bit field. The Test Cell Generator will generate test cells that contain the
header byte pattern, as specified (by the user) in the “Test Cell Header Byte-1 through 4” registers. The payload
portion of each of these test cells will be “filled with” data generated by a Pseudo-Random Byte Sequence (PRBS)
generator.
The Test Cell Receiver functions as the “Test Cell Sink” and bit-error analyzer. The Test Cell Receiver will recognize
each of these test cells by their header byte patterns. Further, the Test Cell Receiver will attempt to analyze the payload
data (within each of these test cells) by acquiring “PRBS Lock” on the data. Once the Test Cell Receiver has “PRBS
Lock” on this test cell payload data, then it can perform error-checking and error-reporting on this data. The “Test and
Diagnostic” section of the UNI performs error reporting by updating the “Test Cell Error Accumulator” registers.
Writing a “1” to this bit-field enables the “Test Cell Generator/Receiver”. Writing a “0” disables the “Test Cell Generator/Receiver”.
For more information on these features, please see Section 4.3.
Bit 2—One Shot Test
This “Read/Write” bit-field allows the user to specify which of two “traffic options” that he/she would like the test cells to
be generated. The UNI “Test and Diagnostic” section supports the following traffic options:
“One Shot” Mode—A single burst of 1024 Test Cells are generated
“Continuous” Mode—A continuous stream of Test Cells are generated for the duration that the “Test Cell Generator/
Receiver” receiver are enabled.
Setting this bit-field to “1”, followed by a “0” to “1” transition in the “Test Cell Enable” bit field (Bit 4 of this register),
causes the Test Cell Generator to operate in the “One Shot” Mode, and generate a single burst of 1024 test cells.
Afterwards the Test Cell Generator will halt, and will cease the production of new test cells, until the next “0” to “1”
transition occurs in the “Test Cell Enable” bit field.
Conversely, setting this bit-field to “0”, followed by a “0” to “1” transition in the “Test Cell Enable” bit field, causes
the Test Cell Generator to operate in the “Continuous” Mode. When the Test Cell Generator is operating in the
“Continuous” mode, it will produce a “continuous” stream of Test Cells, for the duration that the “Test Cell Enable”
bit-field is set to “1”.
Bit 1—One Shot Done
This “Read-Only” bit-field allows the user to monitor the status of the Test Cell Generator, while it is operating in the
“One Shot” Mode. This bit-field will be set to “1”, when the Test Cell Generator has completed its generator of the
“burst” of the 1024 test cells. Conversely, this bit-field will be set to “0” while “test cell generation” is “in process”.
Note:
This bit-field has no meaning if the Test Cell Generator is operating in the “Continuous” Mode.
Address = 06h, Test Cell Control and Status Register
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Unused
Test Cell Enable
Unused
One Shot Test
One Shot Done
PRBS Lock
RO
RO
RO
R/W
RO
R/W
RO
RO
0
0
0
0
0
0
0
0
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