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參數(shù)資料
| 型號(hào)： | WE512K8-300CQA |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | PROM |
| 英文描述： | 512K X 8 EEPROM 5V MODULE, 300 ns, CDIP32 |
| 封裝： | HERMETIC SEALED, SINGLE CAVITY, SIDE BRAZED, CERAMIC, DIP-32 |
| 文件頁(yè)數(shù)： | 8/13頁(yè) |
| 文件大小： | 678K |
| 代理商： | WE512K8-300CQA |
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WE512K8, WE256K8,
WE128K8-XCX
4
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
March 2007
Rev. 2
White Electronic Designs Corp. reserves the right to change products or specications without notice.
FIGURE 4
AC Test Circuit
DC CHARACTERISTICS
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol Conditions
512K x 8
256K x 8
128K x 8
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Input Leakage Current
ILI
VCC = 5.5, VIN = GND to VCC
10
μA
Output Leakage Current
ILO
CS# = VIH, OE# = VIH, Vout = GND to VCC
10
μA
Dynamic Supply Current
ICC
CS# = VIL, OE# = VIH, f = 5MHz, VCC = 5.5
80
100
60
90
50
70
mA
Standby Current
ISB
CS# = VIH, OE# = VIH, f = 5MHz, VCC = 5.5
3
8
2
6
1
4
mA
Output Low Voltage
VOL
IOL = 2.1mA, VCC = 4.5V
0.45
V
Output High Voltage
VOH
IOH = -400μA, VCC = 4.5V
2.4
V
NOTE: DC test conditions: Vih = Vcc -0.3V, Vil = 0.3V
TRUTH TABLE
CS#
OE#
WE#
Mode
Data I/O
H
X
Standby
High Z
L
H
Read
Data Out
L
H
L
Write
Data In
X
H
X
Out Disable
High Z/Data Out
X
H
Write
X
L
X
Inhibit
CAPACITANCE
TA = +25°C
Parameter
Sym
Condition
512Kx8
Max
256Kx8
Max
128Kx8
Max
Unit
Input
Capacitance
CIN VIN = 0V, f = 1MHz
45
80
45
pF
Output
Capacitance
COUT VI/O = 0V, f = 1MHz
60
80
60
pF
This parameter is guaranteed by design but not tested.
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Unit
Operating Temperature
TA
-55 to +125
°C
Storage Temperature
TSTG
-65 to +150
°C
Signal Voltage Any Pin
VG
-0.6 to + 6.25
V
Voltage on OE# and A9
-0.6 to +13.5
V
Thermal Resistance junction
to case
θJC
28
°C/W
Lead Temperature
(soldering -10 secs)
+300
°C
NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of
this specication is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Min
Max
Unit
Supply Voltage
VCC
4.5
5.5
V
Input High Voltage
VIH
2.0
VCC + 0.3
V
Input Low Voltage
VIL
-0.3
+0.8
V
Operating Temp. (Mil.)
TA
-55
+125
°C
Operating Temp. (Ind.)
TA
-40
+85
°C
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes: VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
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