參數(shù)資料
型號(hào)： W78M32VP110BM
廠商： MICROSEMI CORP-PMG MICROELECTRONICS
元件分類(lèi)： PROM
英文描述： 8M X 32 FLASH 3.3V PROM, 110 ns, PBGA159
封裝： 13 X 22 MM, 1.27 MM PITCH, PLASTIC, BGA-159
文件頁(yè)數(shù)： 18/51頁(yè)
文件大?。?/td> 1637K
代理商： W78M32VP110BM
25
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
W78M32VP-XBX
January 2010
Rev. 12
White Electronic Designs Corp. reserves the right to change products or specications without notice.
TABLE 31 AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL - 0, VIH = 2.5
V
Input Rise and Fall
5ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16 mA.
Tester Impedance Z0 = 50
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to similate a typical resistive load circuit.
ATE tester Includes jig capacitance.
TABLE 32 TEST SPECIFICATIONS
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, CL (including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–VIO
V
Input timing measurement reference levels (See Note)
0.5VIO
V
Output timing measurement reference levels
0.5VIO
V
Note: If VIO < VCC, the reference level is 0.5 VIO.
TABLE 33 AC CHARACTERISTICS - READ-ONLY OPERATIONS
VCC = 3.3V ± 0.3V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
-110
Min
Max
-120
Min
Max
Unit
Read Cycle Time
tAVAV
tRC
110
120
ns
Address Access Time
tAVQV
tACC
110
120
ns
Chip Select Access Time
tELQV
tCE
110
120
ns
Page Access Time
tPACC
25
ns
Output Enable to Output Valid (1)
tOLQV
tOE
25
ns
Chip Select High to Output High Z
tEHQZ
tDF
20
ns
Output Enable High to Output High Z
tGHQZ
tDF
20
ns
Output Hold from Addresses, CS# or OE# Change, Whichever
occurs rst
tAXQX
tOH
00
ns
Output Enable Hold Time
Read
tOEH
00
ns
Toggle and Data#
Polling
10
ns
Chip Enable Hold Time
tCEH
35
ns
Note: (1) tOE for data polling is 45ns when VIO = 1.65V to 2.7V and 32ns when VIO = 2.7V to 3.6V.
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