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參數(shù)資料
| 型號(hào)： | TMS37122 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | TIRIS Automotive Devices Analog Front End IC TMS37122 |
| 中文描述： | 提里斯汽車設(shè)備的模擬前端集成電路TMS37122 |
| 文件頁(yè)數(shù)： | 42/73頁(yè) |
| 文件大?。?/td> | 1189K |
| 代理商： | TMS37122 |
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42
Analog Front End IC TMS37122 - Reference Guide
August ’01
2.10.4
Memory Programming
For Programming Test Mode PTx04, TDAT, TCLK and TEN must be connected to a Tester
Unit (see Figure 8). The circuit must be supplied by VBAT and must be activated (Standby
Mode) during all test functions (WDEEN=high).
The Test Mode is addressed by shifting in the 6-bit test number (04hex) using TDAT and
TCLK input (see Figure 24). All data must be supplied with LSB first and the High state at
every input must have VBAT level. TDAT condition should be changed at the negative tran-
sition of TCLK. The data are shifted in with positive transition. After the Data to be pro-
grammed the Row and Nibble information is shifted. Row and Nibble address is binary
coded. After that 16 clocks must be supplied while TEN is high in order to clock the internal
Control Unit. Then the level at TEN can be increased to VPP level and programming is exe-
cuted. Rise and fall time of VPP must be observed.
With deactivation of TEN the circuit resets automatically and is ready for next test command.
VBAT and/or WDEEN must not be initialized.
Table 7: Wake Pattern Waiting Time Options
Wake Pattern Waiting Time
DEC
cwait
ttwait nom.[ms]
MSB
LSB
0
1024
7.6
0
0
0
0
1
2048
15.3
0
0
0
1
2
3072
22.9
0
0
1
0
3
4096
30.5
0
0
1
1
4
5120
38.2
0
1
0
0
5
6144
45.8
0
1
0
1
6
7168
53.4
0
1
1
0
7
8192
61.0
0
1
1
1
8
9216
68.7
1
0
0
0
9
10240
76.3
1
0
0
1
10
11264
83.9
1
0
1
0
11
12288
91.6
1
0
1
1
12
13312
99.2
1
1
0
0
13
14336
106.8
1
1
0
1
14
15360
114.5
1
1
1
0
15
16384
122.1
1
1
1
1
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