參數(shù)資料
型號(hào)： TA1204AF
廠商： Toshiba Corporation
英文描述： ャ CORRECTION IC FOR LCD TV
中文描述： ャ校正集成電路液晶電視
文件頁(yè)數(shù)： 14/25頁(yè)
文件大?。?/td> 575K
代理商： TA1204AF
TA1204AF
2001-02-07 14/25
Note 5:
Maximum amount of contrast adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
VR33 : Max (pin 33
←
5V)
Change SW
33
from a to b, and adjust VR33 until 5V is applied to pin 33. Input a signal (0.7V
p-p
)
including black and white levels at input A. Measure the amplitudes between the black and white
waveform levels at output terminals (pin 21 when X = B, pin 19 when X = G, and pin 14 when X = R).
Calculate their ratio with the typical signal output amplitude and express it in dB units. Repeat this
measurement replacing B, G, and R as the X-axis.
Note 6:
Typical amount of brightness adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
Input a signal (0.7V
p-p
) including black and white levels to input A.
Measure the voltage difference between the black and
γ
0 waveform levels for an output pin (pin 21
when X = G, pin 19 when X = G, and pin 14 when X = R) for positive and negative polarities.
Repeat this measurement replacing B, G, and R as the X-axis.
Note 7:
Maximum amount of brightness adjustment, inter-axis difference
Test condition 4 (CP mode)
Input :
X In1
Test No. 3
VR27 : Max (pin 27
←
0V)
Change SW
27
from OFF to ON, and adjust VR27 until 0V is applied to pin 27.
Input a signal (0.7V
p-p
) including black and white levels in input A (X In1).
Measure the voltage difference between the black and
γ
0 waveform levels for an output pin (pin 21
when X = B, pin 19 when X = G, and pin 14 when X = R).
Repeat this measurement replacing B, G, and R as the X-axis.
Note 8:
Minimum amount of brightness adjustment
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
Change SW
27
from OFF to ON, and adjust VR27 until 5V is applied to pin 27. Input a signal
(0.7V
p-p
) including black and white levels to input A (X In1).
Measure the voltage difference between black and
γ
0 waveform levels for an output pin (pin 21 when
X = B, pin 19 when X = G, and pin 14 when X = R).
Repeat this measurement replacing B, G, and R as the X-axis.
Note 9:
Typical cut-off level, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
Input a signal (0.7V
p-p
) including black and white levels to input A (X In1).
Measure the voltage difference between the
γ
0 levels of the positive and negative polarity outputs in
an output pin (pin 21 when X = B, pin 19 when X = G, and pin 14 when X = R).
Repeat this measurement replacing B, G, and R as the X-axis.
Note 10:
Maximum range of cut-off adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
VR25 : Max (pin 25
←
0V)
Change SW
25
from OFF to ON, and adjust VR25 fully until 0V is applied to pin 25.
Input a signal (0.7V
p-p
) including black and white levels to input A (X In1).
Measure the voltage difference between the
γ
0 level of the positive output and that of the negative
output in an output pin (pin 21 when X = B, pin 19 when X = G, and pin 14 when X = R).
Repeat this measurement replacing B, G, and R as the X-axis.
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