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| 型號： | ST7LITE10F1M6 |
| 英文描述： | FUSE PULLER/TESTERFUSE PULLER/TESTER; Depth, external:15mm; Length:60mm; Voltage rating, AC:24V; Voltage rating, DC:24V; Width, external:20mm |
| 中文描述： | ST7LITE1 - 8單電壓閃存EEPROM的MEMORY.DATA位MCU。 ADC的。 4定時器。的SPI |
| 文件頁數(shù)： | 92/122頁 |
| 文件大小： | 1716K |
| 代理商： | ST7LITE10F1M6 |
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ST7LITE0, ST7SUPERLITE
92/122
1
EMC CHARACTERISTICS
(Cont’d)
13.7.2.2 Static and Dynamic Latch-Up
I
LU
: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 ST7 application note.
I
DLU
: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in
Figure 62
. For
more details, refer to the AN1181 ST7
application note.
Electrical Sensitivities
Figure 62. Simplified Diagram of the ESD Generator for DLU
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
Symbol
Parameter
Conditions
Class
1)
LU
Static latch-up class
T
A
=
+25°C
T
A
=
+85°C
V
DD
=
5.5V, f
OSC
=
4MHz, T
A
=
+25°C
A
A
A
DLU
Dynamic latch-up class
R
CH
=50M
R
D
=330
C
S
=
150pF
ESD
GENERATOR
2)
HV RELAY
DISCHARGE TIP
DISCHARGE
RETURN CONNECTION
ST7
V
DD
V
SS
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