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參數(shù)資料
| 型號： | SNJ54BCT8245AJT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CDIP24 |
| 封裝： | CERAMIC, DIP-24 |
| 文件頁數(shù)： | 25/30頁 |
| 文件大?。?/td> | 630K |
| 代理商： | SNJ54BCT8245AJT |
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SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E MAY 1990 REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1A8
A-bus I/O ports. See function table for normal-mode logic. Internal pullups force these I/O ports to a high level if left
unconnected.
B1B8
B-bus I/O ports. See function table for normal-mode logic. Internal pullups force these I/O ports to a high level if left
unconnected.
DIR
Normal-function direction-control input. See function table for normal-mode logic. An internal pullup forces DIR to a high
level if left unconnected.
GND
Ground
OE
Normal-function output-enable input. See function table for normal-mode logic. An internal pullup forces OE to a high level
if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces
TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active
and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional test reset
signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high (VIHH), at TMS.
VCC
Supply voltage
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