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參數(shù)資料
| 型號(hào)： | SN74BCT8373ADWRE4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24 |
| 封裝： | PLASTIC, SO-24 |
| 文件頁數(shù)： | 26/26頁 |
| 文件大?。?/td> | 530K |
| 代理商： | SN74BCT8373ADWRE4 |
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SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES
WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 18 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function output pin. The BSR is used 1) to store test
data that is to be applied internally to the inputs of the normal on-chip logic and/or externally to the device output
pins, and/or 2) to capture data that appears internally at the outputs of the normal on-chip logic and/or externally
at the device input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR may change during Run-Test/Idle as determined by the current instruction. The contents
of the BSR are not changed in Test-Logic-Reset.
The BSR order of scan is from TDI through bits 17 – 0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
17
LE
15
1D
7
1Q
16
OE
14
2D
6
2Q
–
13
3D
5
3Q
–
12
4D
4
4Q
–
11
5D
3
5Q
–
10
6D
2
6Q
–
9
7D
1
7Q
–
8
8D
0
8Q
boundary-control register
The boundary-control register (BCR) is two bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE
instruction set. Such operations
include PRPG and PSA. Table 3 shows the test operations that are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 10, which selects the PSA test operation. The BCR order of scan is shown in
Figure 3.
TDO
TDI
Bit 0
(LSB)
Bit 1
(MSB)
Figure 3. Boundary-Control Register Order of Scan
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8373ADWRG4 | 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Scan Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8373ANT | 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8373ANTE4 | 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8373DW | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN74BCT8373DWR | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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