參數(shù)資料
型號: SN74ABT18640DLR
廠商: TEXAS INSTRUMENTS INC
元件分類: 總線收發(fā)器
英文描述: ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56
封裝: GREEN, PLASTIC, SSOP-56
文件頁數(shù): 12/32頁
文件大?。?/td> 638K
代理商: SN74ABT18640DLR
SN54ABT18640, SN74ABT18640
SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS267C – FEBRUARY 1994 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN74ABT18640 is available in TI’s shrink small-outline (DL) and thin shrink small-outline (DGG) packages,
which provide twice the I/O pin count and functionality of standard small-outline packages in the same
printed-circuit-board area.
The SN54ABT18640 is characterized for operation over the full military temperature range of –55
°C to 125°C.
The SN74ABT18640 is characterized for operation from –40
°C to 85°C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
OPERATION
OE
DIR
OPERATION
L
B data to A bus
L
HA data to B bus
H
X
Isolation
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