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參數(shù)資料
| 型號(hào)： | SCAN162512ASM |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | SCAN/JTAG/3J SERIES, DUAL 8-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PBGA64 |
| 封裝： | BGA-64 |
| 文件頁(yè)數(shù)： | 4/11頁(yè) |
| 文件大?。?/td> | 163K |
| 代理商： | SCAN162512ASM |
Pin Descriptions
Pin
Description
Name
A1
0-A17,
A2
0-A27
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1
0-B17,
B2
0-B27
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB
1,
CLKBA
1,
CLKAB
2,
CLKBA
2
Normal-function clock inputs.See function table for normal-mode logic.
GND
Ground
V
CC
Supply Voltage
LEAB
1,
LEBA
1,
LEAB
2,
LEBA
2
Normal-function latch enables. See function table for normal-mode logic.
OEAB
1,
OEBA
1,
OEAB
2,
OEBA
2
Normal-function output enables. See function table for normal-mode logic.
TDO
The Test Data Output to support IEEE Std 1149.1-1990. TDO is the serial output for shifting data through
the instruction register or selected data register.
TMS
The Test Mode Select input to support IEEE Std 1149.1-1990. TMS directs the device through it’s TAP
controller states. An internal pull-up forces TMS high if left unconnected.
TCK
The Test Clock input to support IEEE Std 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
The Test Data Input to support IEEE Std 1149.1-1990. TDI is the serial input to shift data through the
instruction register or the selected data register. An internal pull-up resistor forces TDI high if left
unconnected.
TRST
The Test Reset Input to support IEEE Std 1149.1-1990. TRST is the asynchronous reset pin which will
force the TAP controller to it’s initialization state when active. An internal pullup resistor forces TRST high if
left unconnected.
BGA Pinout
1234567
8
A
A1
0
A1
2
A1
4
A1
6
A2
0
A2
2
A2
4
A2
6
B
A1
1
A1
3
A1
5
A1
7
A2
1
A2
3
A2
5
A2
7
C
TRST
CLKAB
1
LEAB
1
OEAB
1
GND
CLKAB
2
LEAB
2
OEAB
2
D
TMS
GND
V
CC
GND
V
CC
GND
TDI
TDO
E
TCK
GND
V
CC
V
CC
GND
N/C
V
CC
F
CLKBA
1
LEBA
1
OEBA
1
GND
N/C
CLKBA
2
LEBA
2
OEBA
2
G
B1
1
B1
3
B1
5
B1
7
B2
1
B2
3
B2
5
B2
7
H
B1
0
B1
2
B1
4
B1
6
B2
0
B2
2
B2
4
B2
6
SCAN16512A
www.national.com
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| SCAN162512ASM/NOPB | 功能描述:IC UNIV BUS TXRX 16BIT 64FBGA RoHS:是 類別:集成電路 (IC) >> 邏輯 - 通用總線函數(shù) 系列:SCAN 產(chǎn)品變化通告:Product Discontinuation 09/Dec/2010 標(biāo)準(zhǔn)包裝:1,500 系列:74AVC 邏輯類型:通用總線驅(qū)動(dòng)器 輸入數(shù):- 電路數(shù):18 位 輸出電流高，低:12mA，12mA 電源電壓:1.65 V ~ 3.6 V 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:56-TFSOP（0.240"，6.10mm 寬） 供應(yīng)商設(shè)備封裝:56-TSSOP 包裝:帶卷 (TR) |
| SCAN162512SM | 功能描述:IC UNIV BUS TXRX 16BIT 64FBGA RoHS:否 類別:集成電路 (IC) >> 邏輯 - 通用總線函數(shù) 系列:SCAN 產(chǎn)品變化通告:Product Discontinuation 09/Dec/2010 標(biāo)準(zhǔn)包裝:1,500 系列:74AVC 邏輯類型:通用總線驅(qū)動(dòng)器 輸入數(shù):- 電路數(shù):18 位 輸出電流高，低:12mA，12mA 電源電壓:1.65 V ~ 3.6 V 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:56-TFSOP（0.240"，6.10mm 寬） 供應(yīng)商設(shè)備封裝:56-TSSOP 包裝:帶卷 (TR) |
| SCAN162602SM | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE-R Outputs |
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| SCAN16512 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
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