參數(shù)資料
型號(hào)： SAK-XC2785X-104F80L
廠商： INFINEON TECHNOLOGIES AG
元件分類： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP144
封裝： 0.50 MM PITCH, GREEN, PLASTIC, LQFP-144
文件頁數(shù)： 139/141頁
文件大小： 1793K
代理商： SAK-XC2785X-104F80L
XC2785X
XC2000 Family / Base Line
Electrical Parameters
Data Sheet
97
V2.1, 2011-07
Broken wire detection
delay against VAGND
2)
t
BWG CC
50
3)
Broken wire detection
delay against VAREF
t
BWR CC
50
4)
Conversion time for 8-bit
t
c8 CC
(11 + STC) x
t
ADCI
+ 2 x
t
SYS
Conversion time for 10-bit
t
c10 CC
(13 + STC) x
t
ADCI
+ 2 x
t
SYS
Total Unadjusted Error
|TUE|
CC
12
LSB
5)
Wakeup time from analog
powerdown, fast mode
t
WAF CC
4
μs
Wakeup time from analog
powerdown, slow mode
t
WAS CC
15
μs
Analog reference ground
V
AGND
SR
V
SS
- 0.05
1.5
V
Analog input voltage
range
V
AIN SR
V
AGND
V
AREF
V
6)
Analog reference voltage
V
AREF
SR
V
AGND
+ 1.0
V
DDPA
+ 0.05
V
1) These parameter values cover the complete operating range. Under relaxed operating conditions (room
temperature, nominal supply voltage) the typical values can be used for calculation.
2) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result. Values for the
basic clock
t
ADCI depend on programming.
3) The broken wire detection delay against
V
AGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500 s. Result below 10% (66
H).
4) The broken wire detection delay against
V
AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10 s. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332
H).
5) TUE is tested at
V
AREF = VDDPA = 5.0 V, VAGND = 0 V. It is verified by design for all other voltages within the
defined voltage range. The specified TUE is valid only if the absolute sum of input overload currents on analog
port pins (see
I
OV specification) does not exceed 10 mA, and if VAREF and VAGND remain stable during the
measurement time.
6)
V
AIN may exceed VAGND or VAREF up to the absolute maximum ratings. However, the conversion result in these
cases will be X000
H or X3FFH, respectively.
Table 18
ADC Parameters
(cont’d)
Parameter
Symbol
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SAK-XC2785X-104F80L AA 功能描述:16位微控制器 - MCU 16 BIT FLASH C11 BCS RoHS:否 制造商:Texas Instruments 核心:RISC 處理器系列:MSP430FR572x 數(shù)據(jù)總線寬度:16 bit 最大時(shí)鐘頻率:24 MHz 程序存儲(chǔ)器大小:8 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:2 V to 3.6 V 工作溫度范圍:- 40 C to + 85 C 封裝 / 箱體:VQFN-40 安裝風(fēng)格:SMD/SMT
SAK-XC2785X-72F80L AA 功能描述:IC MCU 32BIT FLASH 144-LQFP RoHS:是 類別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:XC27x5X 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:260 系列:73S12xx 核心處理器:80515 芯體尺寸:8-位 速度:24MHz 連通性:I²C，智能卡，UART/USART，USB 外圍設(shè)備:LED，POR，WDT 輸入/輸出數(shù):9 程序存儲(chǔ)器容量:64KB（64K x 8） 程序存儲(chǔ)器類型:閃存 EEPROM 大小:- RAM 容量:2K x 8 電壓 - 電源 (Vcc/Vdd):2.7 V ~ 5.5 V 數(shù)據(jù)轉(zhuǎn)換器:- 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 85°C 封裝/外殼:68-VFQFN 裸露焊盤 包裝:管件
SAK-XC2785X-72F80LAA 功能描述:16位微控制器 - MCU 16 BIT FLASH C11 BCS RoHS:否 制造商:Texas Instruments 核心:RISC 處理器系列:MSP430FR572x 數(shù)據(jù)總線寬度:16 bit 最大時(shí)鐘頻率:24 MHz 程序存儲(chǔ)器大小:8 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:2 V to 3.6 V 工作溫度范圍:- 40 C to + 85 C 封裝 / 箱體:VQFN-40 安裝風(fēng)格:SMD/SMT
SAK-XC2786X-96F66L 制造商:Infineon Technologies AG 功能描述:
SAK-XC2786X-96F66L AC 功能描述:16位微控制器 - MCU 16 BIT FLASH C11 BCS RoHS:否 制造商:Texas Instruments 核心:RISC 處理器系列:MSP430FR572x 數(shù)據(jù)總線寬度:16 bit 最大時(shí)鐘頻率:24 MHz 程序存儲(chǔ)器大小:8 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:2 V to 3.6 V 工作溫度范圍:- 40 C to + 85 C 封裝 / 箱體:VQFN-40 安裝風(fēng)格:SMD/SMT
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