參數(shù)資料
型號: NAND01GW3A2AN1
廠商: STMICROELECTRONICS
元件分類: PROM
英文描述: 128M X 8 FLASH 3V PROM, 35 ns, PDSO48
封裝: 12 X 20 MM, PLASTIC, TSOP-48
文件頁數(shù): 28/57頁
文件大小: 916K
代理商: NAND01GW3A2AN1
NAND128-A, NAND256-A, NAND512-A, NAND01G-A
34/57
DC AND AC PARAMETERS
This section summarizes the operating and mea-
surement conditions, and the DC and AC charac-
teristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are de-
rived from tests performed under the Measure-
ment
Conditions
summarized
in
Designers should check that the operating condi-
tions in their circuit match the measurement condi-
tions when relying on the quoted parameters.
Table 16. Operating and AC Measurement Conditions
Table 17. Capacitance
Note: TA = 25°C, f = 1 MHz. CIN and CI/O are not 100% tested.
Parameter
NAND Flash
Units
Min
Max
Supply Voltage (VDD)
1.8V devices
1.7
1.95
V
3V devices
2.7
3.6
V
Ambient Temperature (TA)
Grade 1
0
70
°C
Grade 6
–40
85
°C
Load Capacitance (CL) (1 TTL GATE and CL)
1.8V devices
30
pF
3V devices (2.7 - 3.6V)
50
pF
3V devices (3.0 - 3.6V)
100
pF
Input Pulses Voltages
1.8V devices
0
VDD
V
3V devices
0.4
2.4
V
Input and Output Timing Ref. Voltages
1.8V devices
0.9
V
3V devices
1.5
V
Input Rise and Fall Times
5
ns
Output Circuit Resistors, Rref
8.35
k
Symbol
Parameter
Test Condition
Typ
Max
Unit
CIN
Input Capacitance
VIN = 0V
10
pF
CI/O
Input/Output Capacitance
VIL = 0V
10
pF
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