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參數(shù)資料
| 型號(hào)： | MPC5566MZP144 |
| 廠商： | Freescale Semiconductor |
| 文件頁數(shù)： | 15/66頁 |
| 文件大小： | 0K |
| 描述： | IC MCU 32BIT 3MB FLASH 416PBGA |
| 標(biāo)準(zhǔn)包裝： | 200 |
| 系列： | MPC55xx Qorivva |
| 核心處理器： | e200z6 |
| 芯體尺寸： | 32-位 |
| 速度： | 144MHz |
| 連通性： | CAN，EBI/EMI，以太網(wǎng)，SCI，SPI |
| 外圍設(shè)備： | DMA，POR，PWM，WDT |
| 輸入/輸出數(shù)： | 256 |
| 程序存儲(chǔ)器容量： | 3MB（3M x 8） |
| 程序存儲(chǔ)器類型： | 閃存 |
| RAM 容量： | 128K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 1.35 V ~ 1.65 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 40x12b |
| 振蕩器型： | 外部 |
| 工作溫度： | -40°C ~ 125°C |
| 封裝/外殼： | 416-BBGA |
| 包裝： | 托盤 |
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MPC5566 Microcontroller Data Sheet, Rev. 3
Electrical Characteristics
Freescale Semiconductor
22
3.10
eQADC Electrical Characteristics
Table 13. eQADC Conversion Specifications (TA = TL to TH)
Spec
Characteristic
Symbol
Minimum
Maximum
Unit
1
ADC clock (ADCLK) frequency 1
1 Conversion characteristics vary with FADCLK rate. Reduced conversion accuracy occurs at maximum FADCLK rate. The
maximum value is based on 800 KS/s and the minimum value is based on 20 MHz oscillator clock frequency divided by a
maximum 16 factor.
FADCLK
112
MHz
2
Conversion cycles
Differential
Single ended
CC
13 + 2 (15)
14 + 2 (16)
13 + 128 (141)
14 + 128 (142)
ADCLK
cycles
3
Stop mode recovery time 2
2 Stop mode recovery time begins when the ADC control register enable bits are set until the ADC is ready to perform
conversions.
TSR
10
—
s
4
Resolution 3
3 At VRH – VRL = 5.12 V, one least significant bit (LSB) = 1.25, mV = one count.
—1.25
—
mV
5
INL: 6 MHz ADC clock
INL6
–4
4
Counts 3
6
INL: 12 MHz ADC clock
INL12
–8
8
Counts
7
DNL: 6 MHz ADC clock
DNL6
–3 4
4 Guaranteed 10-bit mono tonicity.
3 4
Counts
8
DNL: 12 MHz ADC clock
DNL12
–6 4
6 4
Counts
9
Offset error with calibration
OFFWC
–4 5
5 The absolute value of the offset error without calibration 100 counts.
4 5
Counts
10
Full-scale gain error with calibration
GAINWC
–8 6
6 The absolute value of the full scale gain error without calibration 120 counts.
8 6
Counts
11
Disruptive input injection current 7, 8, 9, 10
7 Below disruptive current conditions, the channel being stressed has conversion values of: 0x3FF for analog inputs greater than
VRH, and 0x000 for values less than VRL. This assumes that VRH VDDA and VRL VSSA due to the presence of the sample
amplifier. Other channels are not affected by non-disruptive conditions.
8 Exceeding the limit can cause a conversion error on both stressed and unstressed channels. Transitions within the limit do not
affect device reliability or cause permanent damage.
9 Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate
resistance values using VPOSCLAMP = VDDA + 0.5 V and VNEGCLAMP = – 0.3 V, then use the larger of the calculated values.
10 This condition applies to two adjacent pads on the internal pad.
IINJ
–1
1
mA
12
Incremental error due to injection current. All channels are
10 k
< Rs <100 k
Channel under test has Rs = 10 k
,
IINJ = IINJMAX, IINJMIN
EINJ
–4
4
Counts
13
Total unadjusted error (TUE) for single ended conversions
with calibration 11, 12, 13, 14, 15
11 The TUE specification is always less than the sum of the INL, DNL, offset, and gain errors due to canceling errors.
12 TUE does not apply to differential conversions.
13 Measured at 6 MHz ADC clock. TUE with a 12 MHz ADC clock is: –16 counts < TUE < 16 counts.
14 TUE includes all internal device errors such as internal reference variation (75% Ref, 25% Ref).
15 Depending on the input impedance, the analog input leakage current (Table 9. DC Electrical Specifications, spec 35a) can
affect the actual TUE measured on analog channels AN[12], AN[13], AN[14], AN[15].
TUE
–4
4
Counts
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