
4
Motorola Bipolar Power Transistor Device Data
IC(pk)
t
t1
tf
t
IC
VCE
T
C
V
I
C
VCEO(sus)
RBSOA AND INDUCTIVE SWITCHING
RESISTIVE SWITCHING
Lcoil = 10 mH, VCC = 10 V
Rcoil = 0.7
Vclamp = VCEO(sus)
Lcoil = 180
μ
H
Rcoil = 0.05
VCC = 20 V
Vclamp = Rated VCEX Value
VCC = 250 V
RL = 25
Pulse Width = 25
μ
s
t2
TIME
tf CLAMPED
VCE or
Vclamp
tf UNCLAMPED
t2
20
1
0
PW Varied to Attain
IC = 100 mA
2
DRIVER SCHEMATIC
INDUCTIVE TEST CIRCUIT
t1 Adjusted to
Obtain IC
Lcoil (ICpk)
Test Equipment
Scope — Tektronix
475 or Equivalent
RESISTIVE TEST CIRCUIT
OUTPUT WAVEFORMS
For inductive loads pulse width
is adjusted to obtain specified IC
+
10
μ
F
0.05
μ
F
1
2
HP214
– 38 V
PG
IN
50
10
1000
0.005
μ
F
10
2.0
μ
F
2N3762
10
100
+ V DRIVE
RB
0.005
MTP3055E
50
MTP3055E
– Voff
DRIVE
–
+
–
IB1 adjusted to
hFE desired
TURN–OFF TIME
Use inductive switching
driver as the input to
the resistive test circuit.
IB1
1
2
1
INPUT
2
Rcoil
Lcoil
VCC
Vclamp
RS =
0.1
1N4937
OR
EQUIVALENT
TUT
SEE ABOVE FOR
DETAILED CONDITIONS
1
2
TUT
RL
VCC
t1
≈
VCC
t2
≈
Lcoil (ICpk)
VClamp
Table 1. Test Conditions for Dynamic Performance
90% VCEM
IC
90% ICM
tfi
ICM
VCEM
tc
90% IB1
VCE
IB
10% VCEM
10%
ICM
2% IC
tsv
trv
tti
Figure 7. Inductive Switching Measurements
TIME
Vclamp
SWITCHING TIMES NOTE
In resistive switching circuits, rise, fall, and storage times
have been defined and apply to both current and voltage wa-
veforms since they are in phase. However, for inductive
loads which are common to SWITCHMODE power supplies
and hammer drivers, current and voltage waveforms are not
in phase. Therefore, separate measurements must be made
on each waveform to determine the total switching time. For
this reason, the following new terms have been defined.
tsv = Voltage Storage Time, 90% IB1 to 10% Vclamp
trv = Voltage Rise Time, 10–90% Vclamp
tfi = Current Fall Time, 90–10% IC
tti = Current Tail, 10–2% IC
tc = Crossover Time, 10% Vclamp to 10% IC