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參數(shù)資料
| 型號： | MCZ33880EG |
| 廠商： | 飛思卡爾半導(dǎo)體(中國)有限公司 |
| 英文描述： | Configurable Octal Serial Switch with Serial Peripheral Interface I/O |
| 中文描述： | 配置八路系列開關(guān)串行外設(shè)接口的I / O |
| 文件頁數(shù)： | 17/25頁 |
| 文件大?。?/td> | 341K |
| 代理商： | MCZ33880EG |
Analog Integrated Circuit Device Data
Freescale Semiconductor
17
33880
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
POWER CONSUMPTION
The 33880 device has been designed with one sleep and
one operational mode. In the sleep mode (V
DD
≤
2.0 V), the
current consumed by the VPWR pin is less than 25
μ
A. To
place the 33880 in the sleep mode, turn all outputs off, then
remove power from VDD and the EN (enable) input pin. Prior
to removing power from the device, it is recommended all
control inputs from the microcontroller are low. During normal
operation, 4.0 mA will be drawn from the V
DD
supply and
12 mA from the V
PWR
supply.
PARALLELING OF OUTPUTS
Using MOSFETs as output switches allows the connection
of any combination of outputs together. R
DS(ON)
of MOSFETs
have an inherent positive temperature coefficient, providing
balanced current sharing between outputs without
destructive operation. The device can even be operated with
all outputs tied together. This mode of operation may be
desirable in the event the application requires lower power
dissipation or the added capability of switching higher
currents. Performance of parallel operation results in a
corresponding decrease in R
DS(ON)
while the outputs OFF
open load detect currents and the output current limits
increase correspondingly (by a factor of eight if all outputs are
paralleled). Paralleling outputs from two or more different IC
devices are possible but not recommended.
FAULT LOGIC OPERATION
Fault logic of the 33880 device has been greatly simplified
over other devices using SPI communications. As command
word one is being written into the shift register, a fault status
word is being simultaneously written out and received by the
MCU. Regardless of the configuration, with no outputs
faulted, all status bits being received by the MCU will be zero.
When outputs are faulted (off state open circuit or on state
short circuit / overtemperature), the status bits being received
by the MCU will be one. The distinction between open circuit
fault and short circuit overtemperature is completed via the
command word. For example, when a zero command bit is
sent and a one fault is received in the following word, the fault
is open short-to-battery for high-side drive or open short to
ground for low-side drive. In the same manner, when a one
command bit is sent and a one fault is received in the
following word the fault is a short-to-ground overtemperature
for high-side drive or short-to-battery / overtemperature for
low-side drive. The timing between two write words must be
greater than 300
μ
s to allow adequate time to sense and
report the proper fault status.
SPI INTEGRITY CHECK
It is recommended that one check the integrity of the SPI
communication with the initial power-up of the VDD
and EN
pins. After initial system start-up or reset, the MCU will write
one 16-bit pattern to the 33880. The first eight bits read by the
MCU will be the fault status of the outputs, while the second
eight bits will be the first byte of the bit pattern. Bus integrity
is confirmed by the MCU receiving the same bit pattern it
sent. Please note that the second byte the MCU sends to the
device is the command byte and will be transferred to the
outputs with rising edge of
CS
.
OVERTEMPERATURE FAULT
Overtemperature detect and shutdown circuits are
specifically incorporated for each individual output. The
shutdown following an overtemperature condition is
independent of the system clock or any other logic signal.
Each independent output shuts down at 155
°
C to 185
°
C.
When an output shuts down due to an overtemperature fault,
no other outputs are affected. The MCU recognizes the fault
by a one in the fault status register. After the 33880 device
has cooled below the switch point temperature and 15
°
C
hysteresis, the output will activate unless told otherwise by
the MCU via SPI to shut down.
OVERVOLTAGE FAULT
An overvoltage condition on the VPWR
pin will cause the
device to shut down all outputs until the overvoltage condition
is removed. When the overvoltage condition is removed, the
outputs will resume their previous state. This device does not
detect an overvoltage on the VDD pin. The overvoltage
threshold on the VPWR pin is specified as 25 V to 30 V with
1.0 V typical hysteresis. A VPWR overvoltage detect is
global
, causing all outputs to be turned OFF.
OUTPUT OFF OPEN LOAD FAULT
An output OFF open load fault is the detection and
reporting of an
open
load when the corresponding output is
disabled (input bit programmed to a logic low state). The
output OFF open load fault is detected by comparing the
drain-to-source voltage of the specific MOSFET output to an
internally generated reference. Each output has one
dedicated comparator for this purpose.
An output off open load fault is indicated when the drain-
to-source voltage is less than the output threshold voltage
(V
THRES
) of 1.0 V to 3.0 V. Hence, the 33880 will declare the
load
open
in the OFF state when the V
DS
is less than 1.0 V.
This device has an internal 650
μ
A current source
connected from drain to source of the output MOSFET. This
prevents either configuration of the driver from having a
floating output. To achieve low sleep mode quiescent
currents, the open load detect current source of each driver
is switched off when V
DD
is removed.
During output switching, especially with capacitive loads,
a false output OFF open load fault may be triggered. To
prevent this false fault from being reported, an internal fault
filter of 100
μ
s to 300
μ
s is incorporated. A false fault
reporting is a function of the load impedance, R
DS(ON)
, C
OUT
of the MOSFET, as well as the supply voltage, V
PWR
. The
rising edge of
CS
triggers the built-in fault delay timer. The
timer will time out before the fault comparator is enabled and
the fault is detected. Once the condition causing the open
load fault is removed, the device will resume normal
operation. The open load fault however, will be latched in the
output DO register for the MCU to read.
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