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參數(shù)資料
| 型號(hào)： | MAX16032ETM |
| 廠商： | Maxim Integrated Products, Inc. |
| 英文描述： | EEPROM-Based System Monitors with Nonvolatile Fault Memory |
| 中文描述： | 基于EEPROM的非易失性內(nèi)存系統(tǒng)顯示器故障 |
| 文件頁數(shù)： | 37/42頁 |
| 文件大小： | 396K |
| 代理商： | MAX16032ETM |
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M
EEPROM-Based System Monitors
with Nonvolatile Fault Memory
______________________________________________________________________________________
37
Exit2-DR:
A rising edge on TCK with TMS high while in
this state puts the controller in the update-DR state. A
rising edge on TCK with TMS low enters the Shift-DR
state.
Update-DR:
A falling edge on TCK while in the update-
DR state latches the data from the shift register path of
the test data registers into a set of output latches. This
prevents changes at the parallel output because of
changes in the shift register. On the rising edge of TCK,
the controller goes to the run-test/idle state if TMS is
low or it goes to the select-DR-scan state if TMS is high.
Select-IR-Scan:
All test data registers retain their previ-
ous state. The instruction register remains unchanged
during this state. With TMS low, a rising edge on TCK
moves the controller into the capture-IR state. TMS high
during a rising edge on TCK puts the controller back
into the test-logic-reset state.
Capture-IR:
Use the capture-IR state to load the shift
register in the instruction register with a fixed value.
This value is loaded on the rising edge of TCK. If TMS
is high on the rising edge of TCK, the controller enters
the exit1-IR state. If TMS is low on the rising edge of
TCK, the controller enters the shift-IR state.
Shift-IR:
In this state, the shift register in the instruction
register is connected between TDI and TDO and shifts
data one stage for every rising edge of TCK toward the
TDO serial output while TMS is low. The parallel outputs
of the instruction register as well as all test data regis-
ters remain at their previous states. A rising edge on
TCK with TMS high moves the controller to the exit1-IR
state. A rising edge on TCK with TMS low keeps the
controller in the shift-IR state while moving data one
stage through the instruction shift register.
Figure 7. TAP Controller State Diagram
TEST-LOGIC-RESET
1
1
1
1
0
0
RUN-TEST/IDLE
0
0
0
0
1
1
1
0
0
1
0
1
1
0
1
0
1
SELECT-DR-SCAN
SELECT-IR-SCAN
CAPTURE-DR
CAPTURE-IR
SHIFT-DR
SHIFT-IR
EXIT1-DR
EXIT1-IR
PAUSE-DR
PAUSE-IR
EXIT2-DR
EXIT2-IR
UPDATE-DR
UPDATE-IR
0
0
0
0
1
1
0
1
1
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| MAX16032ETM+ | 功能描述:監(jiān)控電路 EEPROM-Based w/NV Fault Memory RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16032ETM+T | 功能描述:監(jiān)控電路 EEPROM-Based w/NV Fault Memory RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16033LLB23+ | 制造商:Maxim Integrated Products 功能描述:VOLT SUPERVISOR MONITOR 2.32V 10PIN UDFN - Rail/Tube |
| MAX16033LLB23+T | 功能描述:監(jiān)控電路 Battery Backup 2.5V-Ep RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16033LLB26+ | 制造商:Maxim Integrated Products 功能描述:VOLT SUPERVISOR MONITOR 2.63V 10PIN UDFN - Rail/Tube |
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