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參數(shù)資料
| 型號： | MAX1434ECQ+D |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 11/22頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 10BIT 50MSPS 100-TQFP |
| 標(biāo)準(zhǔn)包裝： | 90 |
| 位數(shù)： | 10 |
| 采樣率（每秒）： | 50M |
| 數(shù)據(jù)接口： | LVDS，串行 |
| 轉(zhuǎn)換器數(shù)目： | 8 |
| 功率耗散（最大）： | 882mW |
| 電壓電源： | 模擬和數(shù)字 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | * |
| 封裝/外殼： | 100-TQFP 裸露焊盤 |
| 供應(yīng)商設(shè)備封裝： | 100-TQFP（14x14） |
| 包裝： | 托盤 |
| 輸入數(shù)目和類型： | 8 個差分 |
Offset Error
Offset error is a figure of merit that indicates how well
the actual transfer function matches the ideal transfer
function at a single point. For the MAX1434, the ideal
midscale digital output transition occurs when there is -
1/2 LSBs across the analog inputs (Figures 6 and 7).
Bipolar offset error is the amount of deviation between
the measured midscale transition point and the ideal
midscale transition point.
Gain Error
Gain error is a figure of merit that indicates how well the
slope of the actual transfer function matches the slope
of the ideal transfer function. For the MAX1434, the gain
error is the difference of the measured full-scale and
zero-scale transition points minus the difference of the
ideal full-scale and zero-scale transition points.
For the bipolar devices (MAX1434), the full-scale transi-
tion point is from 0x1FE to 0x1FF for two’s-complement
output format (0x3FE to 0x3FF for offset binary) and the
zero-scale transition point is from 0x200 to 0x201 for
two’s complement (0x000 to 0x001 for offset binary).
Crosstalk
Crosstalk indicates how well each analog input is isolated
from the others. For the MAX1434, a 5.3MHz, -0.5dBFS
analog signal is applied to one channel while a 24.1MHz,
-0.5dBFS analog signal is applied to another channel. An
FFT is taken on the channel with the 5.3MHz analog sig-
nal. From this FFT, the crosstalk is measured as the dif-
ference in the 5.3MHz and 24.1MHz amplitudes.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken. See Figure 11.
Aperture Jitter
Aperture jitter (tAJ) is the sample-to-sample variation in
the aperture delay. See Figure 11.
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
SNRdB[max] = 6.02dB x N x 1.76dB
In reality, there are other noise sources besides quantiza-
tion noise: thermal noise, reference noise, clock jitter, etc.
For the MAX1434, SNR is computed by taking the ratio
of the RMS signal to the RMS noise. RMS noise
includes all spectral components to the Nyquist fre-
quency excluding the fundamental, the first six harmon-
ics (HD2–HD7), and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal
to the RMS noise plus distortion. RMS noise plus distor-
tion includes all spectral components to the Nyquist fre-
quency, excluding the fundamental and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB for
a full-scale sinusoidal input waveform is computed from:
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first six harmon-
ics of the input signal to the fundamental itself. This is
expressed as:
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal compo-
nent) to the RMS value of the next-largest spurious
THD
VVV
V
=×
++
+++
20
2
3
2
4
2
5
2
6
2
7
2
1
log
ENOB
SINAD
=
176
602
.
MAX1434
Octal, 10-Bit, 50Msps, 1.8V ADC
with Serial LVDS Outputs
______________________________________________________________________________________
19
CLK
ANALOG
INPUT
SAMPLED
DATA
T/H
tAD
HOLD
TRACK
HOLD
tAJ
Figure 11. Aperture Jitter/Delay Specifications
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| MAX1434ECQ-TD | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
| MAX1434EVKIT | 功能描述:數(shù)據(jù)轉(zhuǎn)換 IC 開發(fā)工具 Evaluation Kit for the MAX1434 MAX1436 MAX1437 MAX1438 RoHS:否 制造商:Texas Instruments 產(chǎn)品:Demonstration Kits 類型:ADC 工具用于評估:ADS130E08 接口類型:SPI 工作電源電壓:- 6 V to + 6 V |
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| MAX1436BECQ+D | 制造商:Maxim Integrated Products 功能描述:ADC OCTAL PIPELINED 40MSPS 12-BIT SERL - Rail/Tube |
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