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SINGLE-CHIP 8-BIT CMOS MICROCOMPUTER
MITSUBISHI MICROCOMPUTERS
Electric Characteristic Differences Among
Mask ROM, Flash Memory, and One Time
PROM Version MCUs
There are differences in electric characteristics, operation margin,
noise immunity, and noise radiation among mask ROM, flash
memory, and One Time PROM version MCUs due to the differ-
ences in the manufacturing processes.
When manufacturing an application system with the flash memory,
One Time PROM version and then switching to use of the mask
ROM version, perform sufficient evaluations for the commercial
samples of the mask ROM version.
DATA REQUIRED FOR MASK ORDERS
The following are necessary when ordering a mask ROM produc-
tion:
1. Mask ROM Order Confirmation Form
2. Mark Specification Form
3. Data to be written to ROM, in EPROM form (three identical cop-
ies) or one floppy disk.
DATA REQUIRED FOR One Time PROM
PROGRAMMING ORDERS
The following are necessary when ordering a PROM programming
service:
1. ROM Programming Confirmation Form
2. Mark Specification Form (only special mark with customer’s
trade mark logo)
3. Data to be programmed to PROM, in EPROM form (three iden-
tical copies) or one floppy disk.
For the mask ROM confirmation and the mark specifications, re-
fer to the “Mitsubishi MCU Technical Information” Homepage
ROM PROGRAMMING METHOD
The built-in PROM of the blank One Time PROM version and buit-
in EPROM version can be read or programmed with a
general-purpose PROM programmer using a special programming
adapter. Set the address of PROM programmer in the user ROM
area.
Table 20 Programming adapter
Package
42P4B, 42S1B
42P2R-A/E
Name of Programming Adapter
PCA4738S-42A
PCA4738F-42A
The PROM of the blank One Time PROM version is not tested or
screened in the assembly process and following processes. To en-
sure proper operation after programming, the procedure shown in
Figure 77 is recommended to verify programming.
Fig. 77 Programming and testing of One Time PROM version
3850 Group (Spec. H/A)
Programming with PROM
programmer
Screening (Caution)
(150 °C for 40 hours)
Verification with
PROM programmer
Functional check in
target device
The screening temperature is far higher
than the storage temperature. Never
expose to 150 °C exceeding 100 hours.
Caution :