
HDSL Framer/Mapper for 1168 kbps Applications
—
LXP710
Datasheet
71
5.0
Test Specifications
Note:
The minimum and maximum values in
Table 115
through
Table 126
and
Figure 11
through
Figure
24
represent the performance specifications of the LXP710 and are guaranteed by test except,
where noted, by design.
Table 115. Absolute Maximum Ratings
Parameter
Symbol
Min
Max
Unit
Supply voltage
Vcc
-0.3
+6.0
V
Input voltage
–
Vcc +0.3
V
Output current
–
–
±25
mA
Storage temperature
t
STOR
-65
+150
°
C
Table 116. Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Unit
DC supply
Vcc
4.75
5.0
5.25
V
Ambient operating temperature
t
A
-40
–
+85
°
C
Table 117. DC Electrical Characteristics
Parameter
Sym
Min
Typ
1
Max
Unit
Test Conditions
Supply current (full operation)
Icc
–
45
70
mA
Input Low voltage
V
IL
–
–
0.14 V
CC
V
Input High voltage
V
IH
0.64 V
CC
–
–
V
Output Low voltage
V
OL
–
–
0.06 V
CC
V
I
OL
< 2 mA
Output High voltage
V
OH
0.64 V
CC
–
–
V
I
OH
< -2 mA
Input leakage current
2
I
IL
–
–
±5
μ
A
0 < V
IN
< V
CC
Tristate leakage current
3
I
3
L
–
–
±5
μ
A
0 < V < V
CC
Input capacitance (individual pins)
C
IN
–
10
–
pF
Load capacitance (REFCLK output)
C
LREF
–
–
15
pF
1. Typical values are at 25
°
C and are for design aid only; not guaranteed and not subject to production testing.
Table 118. E1 Interface Input Timing Specifications
(
Figure 11
)
Parameter
Sym
Min
Typ
1
Max
Unit
Test Conditions
Setup time of E1DATI and
E1FRMI
t
SU
10
–
–
ns
Referenced from falling edge of
E1CLKI.
Hold time of E1DATI and
E1FRMI
t
HT
20
–
–
ns
Referenced from falling edge of
E1CLKI.
E1CLKI period
t
PW
–
488
–
ns
1. Typical values are at 25
°
C and are for design aid only; not guaranteed and not subject to production testing.