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參數(shù)資料
| 型號： | ISD-T360SB |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | VoiceDSP Digital Speech Processor with Master/Slave, Full-Duplex Speakerphone, Multiple Flash and ARAM/DRAM Support |
| 中文描述： | VoiceDSP數(shù)字語音處理器與主/從，全雙工揚(yáng)聲器，多重閃光和雅藍(lán)/內(nèi)存支持 |
| 文件頁數(shù)： | 101/109頁 |
| 文件大小： | 1567K |
| 代理商： | ISD-T360SB |
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2-61
2—SOFTWARE
ISD-T360SB
ISD
Table 2-10: TUNABLE PARAMETERS: Memory Support
Index
Parameter Name
Description
Default
62
Memory Device Size:
NUM_OF_BLOCKS_IN_M
EM
Defines the nubber of blocks (each block is of 4096 bytes) in
every memory device (Flash or ARAM/DRAM). The number
and type of connected devices are defined by the CFG
command.
Flash Device Size (Mbits)
4
8
16
ARAM/DRAM Device Size (Mbits) Number of Blocks Value
16
Number of Blocks Value
128
256
512
508
128
63
Memory Size for Testing
NUM_OF_BLOCKS_FOR_
TEST
Defines the nubber of blocks (each block is of 4096 bytes) in
every memory device (Flash or ARAM/DRAM) for production
line testing purposes.
The number should be small to minimize testing time during
the production sequence. However, the number of blocks
should be larger than the number of expected bad blocks in
the memory device.
In case of value=0, no productiontest is performed.
In any case other than value= 0, the number of blocks is
defined by the parameter value, and a production testing
cycle is performed after RESET.
Legal values: 0 to 128.
Note: If power fails during production testing cycle, the
memory status is unpredicted. The memory device should be
replaced and the production test should be repeated.
0
64
ARAM Quality Level:
MAX_DEFECT_NIBBLES_I
N_BLOCK
Defines the maximum allowed bad nibbles in ARAM block
(each block is of 8192 nibbles). A nibble (4 bits) is considered
bad if any bit is defected.
If the number of bad nibbles in a block exceeds the maximum
allowed value, the block is marked as bad block and is not
used for voice storage.
Legal values: 0 to 255.
0
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