- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄384503 > IRHN3150 (International Rectifier) RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-1) PDF資料下載
參數(shù)資料
| 型號： | IRHN3150 |
| 廠商： | International Rectifier |
| 英文描述： | RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-1) |
| 中文描述： | 抗輻射功率MOSFET表面貼裝系統(tǒng)（SMD - 1） |
| 文件頁數(shù)： | 3/12頁 |
| 文件大?。?/td> | 284K |
| 代理商： | IRHN3150 |
www.irf.com
3
Radiation Characteristics
IRHN7150, JANSR2N7268U
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Parameter
Min Max Min Max
BV
DSS
Drain-to-Source Breakdown Voltage 200 — 200 — V V
GS
= 0V, I
D
= 1.0mA
V
GS(th)
Gate Threshold Voltage
2.0 4.0 1.25 4.5
I
GSS
Gate-to-Source Leakage Forward
— 100 — 100 nA
I
GSS
Gate-to-Source Leakage Reverse
— -100 — -100
I
DSS
Zero Gate Voltage Drain Current
— 25 — 50 μA
R
DS(on)
Static Drain-to-Source
— 0.065 — 0.09
V
GS
= 12V, I
D
=21A
On-State Resistance (TO-3)
R
DS(on)
Static Drain-to-Source
— 0.065 — 0.09
V
GS
= 12V, I
D
=21A
On-State Resistance (SMD-1)
V
SD
Diode Forward Voltage
— 1.4 — 1.4 V
100K Rads(Si)
1
600 to 1000K Rads (Si)
2
Units
Test Conditions
V
GS
= V
DS
, I
D
= 1.0mA
V
GS
= 20V
V
GS
= -20 V
V
DS
=80V, V
GS
=0V
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
1. Part number IRHN7150 (JANSR2N7268U)
2. Part numbers IRHN3150 (JANSF2N7268U), IRHN4150 (JANSG2N7268U) and IRHN8150 (JANSH2N7268U)
Fig a.
Single Event Effect, Safe Operating Area
V
GS
= 0V, IS = 34A
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
For footnotes refer to the last page
Table 2. Single Event Effect Safe Operating Area
Ion
MeV/(mg/cm
2
)) (MeV) (μm)
@
V
GS
=0V @
V
GS
=-5V @
V
GS
=-10V @
V
GS
=-15V @
V
GS
=-20V
Cu
28
285 43 100 100 100 80 60
Br
36.8
305 39 100 90 70 50 —
LET
Energy Range
V
DS(V)
0
20
40
60
80
100
120
0
-5
-10
-15
-20
-25
VGS
V
Cu
Br
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| IRHN4150 | RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-1) |
| IRHN7150 | Female Disconnect Solderless Terminal; Wire Size (AWG):12-10; Tab Width:0.250"; Insulator Color:Yellow; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No |
| IRHN7450 | HEXFET TRANSISTOR |
| IRHN8450 | HEXFET Transistor(HEXFET 晶體管) |
| IRHN8150 | TRANSISTOR N-CHANNEL |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| IRHN3230 | 制造商:International Rectifier 功能描述:HIREL, HEXFET RHD - Bulk |
| IRHN3250 | 制造商:International Rectifier 功能描述:HEXFET, HIREL, RAD HARD,G4 - Bulk |
| IRHN3450 | 制造商:International Rectifier 功能描述:HEXFET, HIREL, RAD HARD,G4 - Bulk |
| IRHN4054 | 制造商:International Rectifier 功能描述:HEXFET, HIREL, RAD HARD,G4 - Bulk |
| IRHN4130 | 制造商:International Rectifier 功能描述:HIREL, HEXFET RHD - Bulk |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。