參數(shù)資料
型號: IDT70125S45J
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: DRAM
英文描述: HIGH-SPEED 2K x 9 DUAL-PORT STATIC RAM WITH BUSY & INTERRUPT
中文描述: 2K X 9 DUAL-PORT SRAM, 45 ns, PQCC52
封裝: 0.750 X 0.750 INCH, 0.170 INCH HEIGHT, PLASTIC, LCC-52
文件頁數(shù): 6/12頁
文件大?。?/td> 168K
代理商: IDT70125S45J
6.10
6
IDT 70121/70125S/L
HIGH-SPEED 2K x 9 DUAL-PORT STATIC RAM WITH BUSY & INTERRUPT
COMMERCIAL TEMPERATURE RANGE
AC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE
(4)
70121X25
70125X25
Min. Max. Min. Max. Min. Max. Min. Max
.
Unit
70121X35
70125X35
70121X45
70125X45
70121X55
70125X55
Symbol
Write Cycle
t
WC
t
EW
t
AW
t
AS
t
WP
t
WR
t
DW
t
HZ
t
DH
t
WZ
t
OW
Parameter
Write Cycle Time
(3)
Chip Enable to End-of-Write
Address Valid to End-of-Write
Address Set-up Time
Write Pulse Width
(6)
Write Recovery Time
Data Valid to End-of-Write
Output High-Z Time
(1,2)
Data Hold Time
(5)
Write Enabled to Output in High-Z
(1,2)
Output Active from End-of-Write
(1,2)
25
20
20
0
20
0
12
0
0
10
10
35
30
30
0
30
0
20
0
0
15
15
45
35
35
0
35
0
20
0
0
20
20
55
40
40
0
40
0
20
0
0
30
30
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
NOTES:
1. Transition is measured
±
500mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter guaranteed by device characterization, but is not production tested.
3. For MASTER/SLAVE combination, t
WC
= t
BAA
+ t
WP,
since R/
W
= V
IL
must occur after t
BAA
.
4. “X” in part numbers indicates power rating (S or L).
5. The specified t
DH
must be met by the device supplying write date to the RAM under all operating conditions.Although t
DH
and
t
ow
values will vary over voltage
and temperature. The actual t
DH
will always be smaller than the actual t
OW.
6. If
OE
is low during a R/
W
controlled write cycle, the write pulse width must be the larger of t
WP
or (t
WZ
+ t
DW
) to allow the I/O drivers to turn off
data to be placed on the bus for the required t
DW
. If
OE
is High during a R/
W
controlled write cycle, this requirement does not apply and the
write pulse can be as short as the specified t
WP.
2654 tbl 09
TIMING WAVEFORM OF WRITE CYCLE NO. 1, R/
W
CONTROLLED TIMING
(1,5,8)
R/
W
t
WC
t
HZ
t
AW
t
HZ
t
AS
t
WP
DATA
OUT
t
DW
t
DH
t
OW
OE
ADDRESS
DATA
IN
CE
t
WZ
(4)
(4)
t
WR
2654 drw 07
(3)
(7)
(2)
(6)
(7)
(7)
NOTES:
1. R/
W
or
CE
must be High during all address transitions.
2. A write occurs during the overlap (t
EW
or t
WP
) of a
CE
= V
IL
and a R/
W
= V
IL
3. t
WR
is measured from the earlier of
CE
or R/
W
going High to the end of the write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the
CE
Low transition occurs simultaneously with or after the R/
W
Low transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (
CE
or R/
W
) is asserted last.
7. This parameter is determined be device characterization, but is not production tested. Transition is measured +/- 500mV from steady state
with the Output Test Load (Figure 2).
8. If
OE
is low during a R/
W
controlled write cycle, the write pulse width must be the larger of t
WP
or (t
WZ
+ t
DW
) to allow the I/O drivers to turn off
data to be placed on the bus for the required t
DW
. If
OE
is High during a R/
W
controlled write cycle, this requirement does not apply and the
write pulse can be as short as the specified t
WP
.
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