參數(shù)資料
型號: HT1MOA2S30
廠商: NXP Semiconductors N.V.
元件分類: 通信及網(wǎng)絡(luò)
英文描述: HITAG 1 transponder IC
封裝: HT1ICS3002W/V6F<Uncased die|<<<1<Always Pb-free,;HT1ICS3002W/V6F<Uncased die|<<<1<Always Pb-free,;HT1MOA2S30/E/3<SOT500|<<<1<Always Pb-free,;
文件頁數(shù): 5/9頁
文件大?。?/td> 75K
代理商: HT1MOA2S30
HT1X_SDS
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product short data sheet
COMPANY PUBLIC
Rev. 3.0 — 16 September 2011
210530
5 of 9
NXP Semiconductors
HT1x
HITAG 1 transponder IC
8. Limiting values
[1]
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any conditions other than those described in the Operating Conditions and Electrical
Characteristics section of this specification is not implied.
[1]
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any conditions other than those described in the Operating Conditions and Electrical
Characteristics section of this specification is not implied.
9. Abbreviations
Table 5.
Acronym
AC
CRC
EEPROM
IC
RF
RWD
Table 3.
Symbol
V
DD
V
ESD
Limiting values - HT1ICS3002W/V6F
[1]
Parameter
supply voltage
electrostatic discharge voltage
Conditions
Min
0.5
2
Max
6.5
-
Unit
V
kV
MIL-STD 883D, Method
3015.7, Human Body
MIL-STD 883D, Method 3023
IN1-IN2
I
lu
I
i(max)
T
j
latch-up current
maximum input current
junction temperature
100
-
55
-
30
+140
mA
mA
C
Table 4.
Symbol
T
stg
T
amb
Limiting values - HT1MOA2S30/E/3
[1]
Parameter
storage temperature
ambient temperature
Conditions
Min
55
25
Max
+125
+85
Unit
C
C
R
th(j-a)
30 K/W @ I
in
= 30 mA
Abbreviations
Description
AntiCollision
Cyclic Redundancy Check
Electrically Erasable Programmable Read-Only Memory
Integrated Circuit
Radio Frequency
Read Write Device
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