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參數(shù)資料
| 型號： | HCS245MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Octal Bus Transceiver, Three-State, Non-Inverting(三態(tài),正相,抗輻射八總線收發(fā)器) |
| 中文描述： | 輻射加固八路總線收發(fā)器，三態(tài)，非反相（三態(tài)，正相，抗輻射八總線收發(fā)器） |
| 文件頁數(shù)： | 5/7頁 |
| 文件大小： | 179K |
| 代理商： | HCS245MS |
7-479
Specifications HCS245MS
TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
2 - 9
1, 10 - 19
-
20
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
-
10
-
1 - 9, 11 - 20
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
10
11 - 18
1, 20
2 - 9
19
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
-
10
1 - 9, 11 - 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing. Group E, Sub-
group 2, sample size is 4 dice/wafer 0 failures.
AC Timing Diagrams
AC VOLTAGE LEVELS
PARAMETER
HCS
UNITS
VCC
4.50
V
VIH
4.50
V
VS
2.25
V
VIL
0
V
GND
0
V
VS
INPUT
OUTPUT
OUTPUT
TTHL
80%
20%
80%
20%
VIH
VIL
VOH
VOL
VOH
VOL
TPLH
TPHL
VS
TTLH
AC Load Circuit
DUT
TEST
POINT
CL
RL
CL = 50pF
RL = 500
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