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參數(shù)資料
| 型號(hào)： | HCS245MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Octal Bus Transceiver, Three-State, Non-Inverting(三態(tài),正相,抗輻射八總線收發(fā)器) |
| 中文描述： | 輻射加固八路總線收發(fā)器，三態(tài)，非反相（三態(tài)，正相，抗輻射八總線收發(fā)器） |
| 文件頁(yè)數(shù)： | 4/7頁(yè) |
| 文件大?。?/td> | 179K |
| 代理商： | HCS245MS |
7-478
Specifications HCS245MS
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC) at 200K RAD,
VIL = 0.12(VCC) at 1M RAD (Note 3)
+25
o
C
-
-
-
-
-
Propagation Delay
Data to Output
TPLH
TPHL
VCC = 4.5V
+25
o
C
2
23
2
28
ns
Enable to Output
TPZL
TPZH
VCC = 4.5V
+25
o
C
2
30
2
36
ns
Enable to Output
TPLZ
TPHZ
VCC = 4.5V
+25
o
C
2
33
2
33
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
μ
A
IOL/IOH
5
-15% of 0 Hour
IOZL/IOZH
5
±
200nA
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
NOTE:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMP-
ERATURE
200K RAD
LIMITS
1M RAD
LIMITS
UNITS
MIN
MAX
MIN
MAX
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