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  • 參數(shù)資料
    型號(hào): EPM7032STI44-7N
    廠商: Altera
    文件頁(yè)數(shù): 18/66頁(yè)
    文件大?。?/td> 0K
    描述: IC MAX 7000 CPLD 32 44-TQFP
    產(chǎn)品變化通告: MAX 7000 Series Obsolescence 08/Jun/2009
    標(biāo)準(zhǔn)包裝: 160
    系列: MAX® 7000
    可編程類(lèi)型: 系統(tǒng)內(nèi)可編程
    最大延遲時(shí)間 tpd(1): 7.5ns
    電壓電源 - 內(nèi)部: 4.5 V ~ 5.5 V
    邏輯元件/邏輯塊數(shù)目: 2
    宏單元數(shù): 32
    門(mén)數(shù): 600
    輸入/輸出數(shù): 36
    工作溫度: -40°C ~ 85°C
    安裝類(lèi)型: 表面貼裝
    封裝/外殼: 44-TQFP
    供應(yīng)商設(shè)備封裝: 44-TQFP(10x10)
    包裝: 托盤(pán)
    其它名稱(chēng): 544-2006
    EPM7032STI44-7N-ND
    Altera Corporation
    25
    MAX 7000 Programmable Logic Device Family Data Sheet
    Design Security
    All MAX 7000 devices contain a programmable security bit that controls
    access to the data programmed into the device. When this bit is
    programmed, a proprietary design implemented in the device cannot be
    copied or retrieved. This feature provides a high level of design security
    because programmed data within EEPROM cells is invisible. The security
    bit that controls this function, as well as all other programmed data, is
    reset only when the device is reprogrammed.
    Generic Testing
    Each MAX 7000 device is functionally tested. Complete testing of each
    programmable EEPROM bit and all internal logic elements ensures 100%
    programming yield. AC test measurements are taken under conditions
    equivalent to those shown in Figure 10. Test patterns can be used and then
    erased during early stages of the production flow.
    Figure 10. MAX 7000 AC Test Conditions
    QFP Carrier &
    Development
    Socket
    MAX 7000 and MAX 7000E devices in QFP packages with 100 or more
    pins are shipped in special plastic carriers to protect the QFP leads. The
    carrier is used with a prototype development socket and special
    programming hardware available from Altera. This carrier technology
    makes it possible to program, test, erase, and reprogram a device without
    exposing the leads to mechanical stress.
    f For detailed information and carrier dimensions, refer to the QFP Carrier
    1
    MAX 7000S devices are not shipped in carriers.
    VCC
    To Test
    System
    C1 (includes JIG
    capacitance)
    Device input
    rise and fall
    times < 3 ns
    Device
    Output
    464
    Ω
    [703
    Ω]
    250
    [8.06
    ]
    Ω
    K
    Ω
    Power supply transients can affect AC
    measurements. Simultaneous
    transitions of multiple outputs should be
    avoided for accurate measurement.
    Threshold tests must not be performed
    under AC conditions. Large-amplitude,
    fast ground-current transients normally
    occur as the device outputs discharge
    the load capacitances. When these
    transients flow through the parasitic
    inductance between the device ground
    pin and the test system ground,
    significant reductions in observable
    noise immunity can result. Numbers in
    brackets are for 2.5-V devices and
    outputs. Numbers without brackets are
    for 3.3-V devices and outputs.
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