
 1060
SAM4CP [DATASHEET]
43051E–ATPL–08/14
E
Integrity Check Monitor (ICM)
Updated 
Section 42.1 “Description” on page 973
.
Added 
Table 42-1
.
Renamed 
Figure 42-1
 (was “Integrity Check Monitor Integrated in the System”).
Section 42.5.1.2 “ICM Region Configuration Structure Member” on page 978
 corrected
configuration value descriptions for bits RHIEN, DMIEN, BEIEN, WCIEN, ECIEN and SUIEN.
SAM4CP Electrical Characteristics
Table 45-5, “I/O DC Characteristics” 
: modified column “Conditions” for all parameters. Added
notes at end of table.
Table 45-7, “Input Characteristics” 
 added mention of voltage reference to VDDIO in
paragraph preceding table.
Updated 
Table 45-8, “SPI Timings” 
.
Modified min and max values in 
Table 45-9, “USART SPI Timings” 
.
Modified max values in 
Table 45-15, “LCD Buffers Characteristics” 
.
Table 45-18, “VDDIO Supply Monitor” 
: added Note (2). Removed figure “VDDIO Supply
Monitor”.
Table 45-24, “32.768 kHz Crystal Oscillator Characteristics” 
: added parameter C
CRYSTAL
.
Modified parameter C
LEXT
 to C
LEXT32K
Modified 
Figure 45-11
 and text below this figure.
Table 45-26, “3 to 20 MHz Crystal Oscillator Characteristics(1)” 
: added parameter C
CRYSTAL
.
Modified parameter C
LEXT
Modified 
Figure 45-12
 and text below this figure.
Table 45-31, “Temperature Sensor Characteristics” 
: modified condition of parameter V
T
settling time.
Table 45-33, “ADC Power Supply Characteristics” 
: modified values for supply voltage range
(VDDIN).
Table 45-34, “ADC Voltage Reference Input Characteristics (ADVREF pin)” 
: modified min
value of V
ADVREF
Table 45-39, “Programmable Voltage Reference Characteristics” 
: modified V
ADVREF
Section 45.7.3 “Sleep Mode Current Consumption” on page 1042
: modified information on
sub-system frequencies.
Marking
Added this chapter.
Errata
Added this chapter.
Doc. Rev.
43051
Comments
Change 
Request 
Ref.