the reference inputs (CREF
參數(shù)資料
型號(hào): DC1010A-B
廠商: Linear Technology
文件頁(yè)數(shù): 10/24頁(yè)
文件大?。?/td> 0K
描述: BOARD DELTA SIGMA ADC LTC2489
軟件下載: QuikEval System
設(shè)計(jì)資源: DC1010A Design File
DC1010A Schematic
標(biāo)準(zhǔn)包裝: 1
系列: Easy Drive™, QuikEval™
ADC 的數(shù)量: 1
位數(shù): 16
采樣率(每秒): 7.5
數(shù)據(jù)接口: I²C,串行
已用 IC / 零件: LTC2489
已供物品:
相關(guān)產(chǎn)品: LTC2489IDE#TRPBF-ND - IC ADC 16BIT DELTA SIG 14-DFN
LTC2489CDE#TRPBF-ND - IC ADC 16BIT DELTA SIG 14-DFN
LTC2489CDE#PBF-ND - IC ADC 16BIT DELTA SIG 14-DFN
LTC2489IDE#PBF-ND - IC ADC 16BIT DELTA SIG 14-DFN
LTC2489
18
2489fa
In cases where large bypass capacitors are required on
the reference inputs (CREF > .01μF), full-scale and linear-
ity errors are proportional to the value of the reference
resistance. Every ohm of reference resistance produces
a full-scale error of approximately 0.5ppm (while operat-
ing with the internal oscillator) (see Figures 12 and 13). If
the input common mode voltage is equal to the reference
common mode voltage, a linearity error of approximately
0.67ppm per 100
Ω of reference resistance results (see
Figure 14). In applications where the input and reference
common mode voltages are different, the errors increase.
A 1V difference in between common mode input and
common mode reference results in a 6.7ppm INL error
for every 100
Ω of reference resistance.
In addition to the reference sampling charge, the reference
ESD protection diodes have a temperature dependent leak-
age current. This leakage current, nominally 1nA (±10nA
max) results in a small, gain error. A 100
Ω reference
resistance will create a 0.5μV full-scale error.
Normal Mode Rejection and Antialiasing
One of the advantages delta-sigma ADCs offer over
conventional ADCs is on-chip digital filtering. Combined
with a large oversample ratio, the LTC2489 significantly
simplifies antialiasing filter requirements. Additionally,
the input current cancellation feature allows external low
pass filtering without degrading the DC performance of
the device.
APPLICATIONS INFORMATION
Figure 14. INL vs Differential Input Voltage and
Reference Source Resistance for CREF > 1μF
Figure 12. +FS Error vs RSOURCE at VREF (Large CREF)
Figure 13. –FS Error vs RSOURCE at VREF (Large CREF)
RSOURCE (Ω)
0
+FS
ERROR
(ppm) 300
400
500
800
2489 F12
200
100
0
200
400
600
1000
VCC = 5V
VREF = 5V
VIN
+ = 3.75V
VIN
= 1.25V
fO = GND
TA = 25°C
CREF = 1μF, 10μF
CREF = 0.1μF
CREF = 0.01μF
RSOURCE (Ω)
0
–FS
ERROR
(ppm) –200
–100
0
800
2489 F13
–300
–400
–500
200
400
600
1000
VCC = 5V
VREF = 5V
VIN
+ = 1.25V
VIN
= 3.75V
fO = GND
TA = 25°C
CREF = 1μF, 10μF
CREF = 0.1μF
CREF = 0.01μF
VIN/VREF
–0.5
INL
(ppm
OF
V
REF
)
2
6
10
0.3
2489 F14
–2
–6
0
4
8
–4
–8
–10
–0.3
–0.1
0.1
0.5
VCC = 5V
VREF = 5V
VIN(CM) = 2.5V
TA = 25°C
CREF = 10μF
R = 1k
R = 100Ω
R = 500Ω
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