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參數(shù)資料
| 型號： | CLC031 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | SMPTE 292M/259M Digital Video Deserializer / Descrambler with Video and Ancilliary Data FIFOs |
| 中文描述： | 的SMPTE 292M/259M數(shù)字視頻解串器/解擾器的視頻和輔助數(shù)據(jù)FIFO |
| 文件頁數(shù)： | 8/31頁 |
| 文件大?。?/td> | 383K |
| 代理商： | CLC031 |
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AC Electrical Characteristics
(Continued)
Note 3:
Typical values are stated for V
DDIO
= V
DDSI
= +3.3V, V
DDD
= V
DDPLL
= +2.5V and T
A
= +25C.
Note 4:
Spec. is guaranteed by design.
Note 5:
Measured from rising-edge of first SDI cycle until Lock Detect bit goes high (true). Lock time includes CDR phase acquisition time plus PLL lock time.
Note 6:
V
OHV
and V
OLP
are measured with respect to reference ground. V
OLP
is the peak output LOW voltage or ground bounce that may occur under dynamic
simultaneous output switching conditions. V
OHV
is the lowest output HIGH voltage or output droop that may occur under dynamic simultaneous output switching
conditions.
Note 7:
When used to clock control data into or from the CLC031, the duty cycle restriction does not apply.
Note 8:
I
IH
includes static current required by input pull-down devices.
Note 9:
Required Input Conditions are the electrical signal conditions or component values which shall be supplied by the circuit in which this device is used in order
for it to produce the specified DC and AC electrical output characteristics.
Note 10:
Functional and certain other parametric tests utilize a CLC030 as the input source to the SDI inputs of the CLC031. The CLC030 is DC coupled to the
inputs of the CLC031. Typical V
IN
= 800 mV, V
CM
= 2.9 V.
Test Loads
20020104
C
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