參數(shù)資料
型號： CD4029BMS
廠商： Intersil Corporation
元件分類： 通用總線功能
英文描述： CMOS Presettable Up/Down Counter(CMOS可預(yù)置加/減計數(shù)器)
中文描述： 的CMOS可預(yù)置加/減計數(shù)器的CMOS（可預(yù)置加/減計數(shù)器）
文件頁數(shù)： 6/11頁
文件大?。?/td> 124K
代理商： CD4029BMS
7-803
Specifications CD4029BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
±
-0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 1
Note 1
2, 6, 7, 11, 14
1, 3 - 5, 8 - 10, 12,
13, 15
16
Static Burn-In 2
Note 1
2, 6, 7, 11, 14
8
1, 3 - 5, 9, 10, 12,
13, 15, 16
Dynamic Burn-
In Note 1
-
1, 3 - 5, 8, 12, 13
9, 10, 16
2, 6, 7, 11, 14
15
-
Irradiation
Note 2
2, 6, 7, 11, 14
8
1, 3 - 5, 9, 10, 12,
13, 15, 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
±
0.5V
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