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參數(shù)資料
| 型號(hào)： | CAT24C161 |
| 英文描述： | Supervisory Circuits with I 2 C Serial CMOS E 2 PROM, Precision Reset Controller and Watchdog Timer(帶16K IIC串行CMOS EEPROM，精密復(fù)位控制器和看門狗定時(shí)器的監(jiān)控電路) |
| 中文描述： | 監(jiān)控電路與I 2 C串行的CMOS 2 PROM的位置，精密復(fù)位控制器和看門狗定時(shí)器（帶16K的進(jìn)口證的CMOS串行EEPROM的，精密復(fù)位控制器和看門狗定時(shí)器的監(jiān)控電路） |
| 文件頁(yè)數(shù)： | 2/12頁(yè) |
| 文件大?。?/td> | 85K |
| 代理商： | CAT24C161 |
CAT24CXX1/XX2
2
Advanced
Doc. No. 25079-00 1/98 M-1
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias....................–55
°
C to +125
°
C
Storage Temperature........................ –65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
..............–2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground..................–2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25
°
C)1.0W.................................1.0W
Lead Soldering Temperature (10 secs)...............300
°
C
Output Short Circuit Current
(2)
..........................100mA
COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
RELIABILITY CHARACTERISTICS
Symbol Parameter
Min.
Max. Units Reference Test Method
N
END(3)
T
DR(3)
V
ZAP(3)
I
LTH(3)(4)
Endurance 1,000,000 Cycles/Byte
MIL-STD-883, Test Method 1033
Data Retention 100 Years
MIL-STD-883, Test Method 1008
ESD Susceptibility 2000 Volts
MIL-STD-883, Test Method 3015
Latch-up 100 mA
JEDEC Standard 17
D.C. OPERATING CHARACTERISTICS
V
CC
= +2.7V to +6.0V, unless otherwise specified.
Symbol Parameter Min. Typ. Max.
Units Test Conditions
I
CC
Power Supply Current
3
mA f
SCL
= 100 KHz
Isb
Standby Current
40
μ
A
Vcc=3.3V
50
μ
A Vcc=5
μ
A V
IN
=G
ND
or V
CC
10
μ
A V
IN
=G
ND
or V
CC
I
LI
Input Leakage Current
2
I
LO
Output Leakage Current
V
IL
Input Low Voltage –1 V
CC
x 0.3 V
V
IH
Input High Voltage
V
CC
x 0.7 V
CC
+ 0.5 V
V
OL
Output Low Voltage (SDA)
0.4 V I
OL
= 3 mA ,V
CC
=3.0V
Limits
CAPACITANCE
T
A
= 25
°
C, f = 1.0 MHz, V
CC
= 5V
Symbol Test
C
I/O(3)
Input/Output Capacitance (SDA)
C
IN(3)
Input Capacitance (SCL)
Max.
Units
Conditions
8
pF
V
I/O
= 0V
6
pF
V
IN
= 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
CC
+1V.
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