- 鎮ㄧ従(xi脿n)鍦ㄧ殑浣嶇疆锛�璨疯常IC缍�(w菐ng) > PDF鐩寗3794 > C8051F587-IM (Silicon Laboratories Inc)IC 8051 MCU 96K FLASH 32-QFN PDF璩囨枡涓嬭級
鍙冩暩(sh霉)璩囨枡
| 鍨嬭櫉(h脿o)锛� | C8051F587-IM |
| 寤犲晢锛� | Silicon Laboratories Inc |
| 鏂囦欢闋�(y猫)鏁�(sh霉)锛� | 60/356闋�(y猫) |
| 鏂囦欢澶�?銆�?/td> | 0K |
| 鎻忚堪锛� | IC 8051 MCU 96K FLASH 32-QFN |
| 鎳�(y墨ng)鐢ㄨ(shu艒)鏄庯細 | LIN Bootloader AppNote |
| 鐢�(ch菐n)鍝佸煿瑷�(x霉n)妯″锛� | Serial Communication Overview |
| 妯�(bi膩o)婧�(zh菙n)鍖呰锛� | 73 |
| 绯诲垪锛� | C8051F58x |
| 鏍稿績铏曠悊鍣細 | 8051 |
| 鑺珨灏哄锛� | 8-浣� |
| 閫熷害锛� | 50MHz |
| 閫ｉ€氭€э細 | SMBus锛�2 绶�/I²C锛�锛孲PI锛孶ART/USART |
| 澶栧湇瑷�(sh猫)鍌欙細 | POR锛孭WM锛屾韩搴﹀偝鎰熷櫒锛學DT |
| 杓稿叆/杓稿嚭鏁�(sh霉)锛� | 25 |
| 绋嬪簭瀛樺劜(ch菙)鍣ㄥ閲忥細 | 96KB锛�96K x 8锛� |
| 绋嬪簭瀛樺劜(ch菙)鍣ㄩ鍨嬶細 | 闁冨瓨 |
| RAM 瀹归噺锛� | 8.25K x 8 |
| 闆诲 - 闆绘簮 (Vcc/Vdd)锛� | 1.8 V ~ 5.25 V |
| 鏁�(sh霉)鎿�(j霉)杞�(zhu菐n)鎻涘櫒锛� | A/D 25x12b |
| 鎸暕鍣ㄥ瀷锛� | 鍏�(n猫i)閮� |
| 宸ヤ綔婧害锛� | -40°C ~ 125°C |
| 灏佽/澶栨锛� | 32-VFQFN 瑁搁湶鐒婄洡 |
| 鍖呰锛� | 绠′欢 |
| 鍏跺畠鍚嶇ū锛� | 336-1579-5 |
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C8051F58x/F59x
152
Rev. 1.2
17.2. Power-Fail Reset/VDD Monitor
When a power-down transition or power irregularity causes VDD to drop below VRST, the power supply
monitor will drive the RST pin low and hold the CIP-51 in a reset state (see Figure 17.2). When VDD returns
to a level above VRST, the CIP-51 will be released from the reset state. Note that even though internal data
memory contents are not altered by the power-fail reset, it is impossible to determine if VDD dropped below
the level required for data retention. If the PORSF flag reads 1, the data may no longer be valid. The VDD
monitor is enabled after power-on resets. Its defined state (enabled/disabled) is not altered by any other
reset source. For example, if the VDD monitor is disabled by code and a software reset is performed, the
VDD monitor will still be disabled after the reset. To protect the integrity of Flash contents, the VDD
monitor must be enabled to the higher setting (VDMLVL = 1) and selected as a reset source if soft-
ware contains routines which erase or write Flash memory. If the VDD monitor is not enabled and
set to the high level, any erase or write performed on Flash memory will cause a Flash Error device
reset.
Important Note: If the VDD monitor is being turned on from a disabled state, it should be enabled before it
is selected as a reset source. Selecting the VDD monitor as a reset source before it is enabled and stabi-
lized may cause a system reset. In some applications, this reset may be undesirable. If this is not desirable
in the application, a delay should be introduced between enabling the monitor and selecting it as a reset
source. The procedure for enabling the VDD monitor and configuring it as a reset source from a disabled
state is as follows:
1. Enable the VDD monitor (VDMEN bit in VDM0CN = 1).
2. If necessary, wait for the VDD monitor to stabilize (see Table 5.4 for the VDD Monitor turn-on time).
Note: This delay should be omitted if software contains routines that erase or write Flash
memory.
3. Select the VDD monitor as a reset source (PORSF bit in RSTSRC = 1).
See Figure 17.2 for VDD monitor timing; note that the power-on-reset delay is not incurred after a VDD
Note:
The output of the internal voltage regulator is calibrated by the MCU immediately after any reset event. The
output of the un-calibrated internal regulator could be below the high threshold setting of the VDD Monitor. If
this is the case and the VDD Monitor is set to the high threshold setting and if the MCU receives a non-power
on reset (POR), the MCU will remain in reset until a POR occurs (i.e., VDD Monitor will keep the device in reset).
A POR will force the VDD Monitor to the low threshold setting which is guaranteed to be below the un-
calibrated output of the internal regulator. The device will then exit reset and resume normal operation. It is for
this reason Silicon Labs strongly recommends that the VDD Monitor is always left in the low threshold setting
(i.e. default value upon POR).
When programming the Flash in-system, the VDD Monitor must be set to the high threshold setting. For the
highest system reliability, the time the VDD Monitor is set to the high threshold setting should be minimized
(e.g., setting the VDD Monitor to the high threshold setting just before the Flash write operation and then
changing it back to the low threshold setting immediately after the Flash write operation).
鐩搁棞(gu膩n)PDF璩囨枡 |
PDF鎻忚堪 |
|---|---|
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鐩搁棞(gu膩n)浠ｇ悊鍟�/鎶€琛�(sh霉)鍙冩暩(sh霉) |
鍙冩暩(sh霉)鎻忚堪 |
|---|---|
| C8051F587-IMR | 鍔熻兘鎻忚堪:8浣嶅井鎺у埗鍣� -MCU 50 MIPS 96 kB 8 kB SPI 2xUART RoHS:鍚� 鍒堕€犲晢:Silicon Labs 鏍稿績:8051 铏曠悊鍣ㄧ郴鍒�:C8051F39x 鏁�(sh霉)鎿�(j霉)绺界窔瀵害:8 bit 鏈€澶ф檪(sh铆)閻橀牷鐜�:50 MHz 绋嬪簭瀛樺劜(ch菙)鍣ㄥぇ灏�:16 KB 鏁�(sh霉)鎿�(j霉) RAM 澶у皬:1 KB 鐗囦笂 ADC:Yes 宸ヤ綔闆绘簮闆诲:1.8 V to 3.6 V 宸ヤ綔婧害鑼冨湇:- 40 C to + 105 C 灏佽 / 绠遍珨:QFN-20 瀹夎棰�(f膿ng)鏍�:SMD/SMT |
| C8051F587-IQ | 鍔熻兘鎻忚堪:8浣嶅井鎺у埗鍣� -MCU 50MIPS 96kB 8kB SPI 2xUART I2C RoHS:鍚� 鍒堕€犲晢:Silicon Labs 鏍稿績:8051 铏曠悊鍣ㄧ郴鍒�:C8051F39x 鏁�(sh霉)鎿�(j霉)绺界窔瀵害:8 bit 鏈€澶ф檪(sh铆)閻橀牷鐜�:50 MHz 绋嬪簭瀛樺劜(ch菙)鍣ㄥぇ灏�:16 KB 鏁�(sh霉)鎿�(j霉) RAM 澶у皬:1 KB 鐗囦笂 ADC:Yes 宸ヤ綔闆绘簮闆诲:1.8 V to 3.6 V 宸ヤ綔婧害鑼冨湇:- 40 C to + 105 C 灏佽 / 绠遍珨:QFN-20 瀹夎棰�(f膿ng)鏍�:SMD/SMT |
| C8051F587-IQR | 鍔熻兘鎻忚堪:8浣嶅井鎺у埗鍣� -MCU 50 MIPS 96 kB 8 kB SPI 2xUART RoHS:鍚� 鍒堕€犲晢:Silicon Labs 鏍稿績:8051 铏曠悊鍣ㄧ郴鍒�:C8051F39x 鏁�(sh霉)鎿�(j霉)绺界窔瀵害:8 bit 鏈€澶ф檪(sh铆)閻橀牷鐜�:50 MHz 绋嬪簭瀛樺劜(ch菙)鍣ㄥぇ灏�:16 KB 鏁�(sh霉)鎿�(j霉) RAM 澶у皬:1 KB 鐗囦笂 ADC:Yes 宸ヤ綔闆绘簮闆诲:1.8 V to 3.6 V 宸ヤ綔婧害鑼冨湇:- 40 C to + 105 C 灏佽 / 绠遍珨:QFN-20 瀹夎棰�(f膿ng)鏍�:SMD/SMT |
| C8051F588-IM | 鍔熻兘鎻忚堪:8浣嶅井鎺у埗鍣� -MCU 50MIPS128kB 8kB CAN2 LIN2.1SPI 2xUART I2C RoHS:鍚� 鍒堕€犲晢:Silicon Labs 鏍稿績:8051 铏曠悊鍣ㄧ郴鍒�:C8051F39x 鏁�(sh霉)鎿�(j霉)绺界窔瀵害:8 bit 鏈€澶ф檪(sh铆)閻橀牷鐜�:50 MHz 绋嬪簭瀛樺劜(ch菙)鍣ㄥぇ灏�:16 KB 鏁�(sh霉)鎿�(j霉) RAM 澶у皬:1 KB 鐗囦笂 ADC:Yes 宸ヤ綔闆绘簮闆诲:1.8 V to 3.6 V 宸ヤ綔婧害鑼冨湇:- 40 C to + 105 C 灏佽 / 绠遍珨:QFN-20 瀹夎棰�(f膿ng)鏍�:SMD/SMT |
| C8051F588-IMR | 鍔熻兘鎻忚堪:8浣嶅井鎺у埗鍣� -MCU 50 MIPS 128 kB 8 kB CAN2.0 LIN 2.1 SPI RoHS:鍚� 鍒堕€犲晢:Silicon Labs 鏍稿績:8051 铏曠悊鍣ㄧ郴鍒�:C8051F39x 鏁�(sh霉)鎿�(j霉)绺界窔瀵害:8 bit 鏈€澶ф檪(sh铆)閻橀牷鐜�:50 MHz 绋嬪簭瀛樺劜(ch菙)鍣ㄥぇ灏�:16 KB 鏁�(sh霉)鎿�(j霉) RAM 澶у皬:1 KB 鐗囦笂 ADC:Yes 宸ヤ綔闆绘簮闆诲:1.8 V to 3.6 V 宸ヤ綔婧害鑼冨湇:- 40 C to + 105 C 灏佽 / 绠遍珨:QFN-20 瀹夎棰�(f膿ng)鏍�:SMD/SMT |
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