ProASICPLUS Flash Family FPGAs v5.9 2-9 The TAP controller receives two control " />
參數(shù)資料
型號: APA600-CGS624B
廠商: Microsemi SoC
文件頁數(shù): 90/178頁
文件大?。?/td> 0K
描述: IC FPGA PROASIC+ 600K 624-CGA
標準包裝: 1
系列: ProASICPLUS
RAM 位總計: 129024
輸入/輸出數(shù): 440
門數(shù): 600000
電源電壓: 2.3 V ~ 2.7 V
安裝類型: 通孔
封裝/外殼: 624-BCCGA
供應商設備封裝: 624-CCGA(32.5x32.5)
ProASICPLUS Flash Family FPGAs
v5.9
2-9
The TAP controller receives two control inputs (TMS and
TCK) and generates control and clock signals for the rest
of the test logic architecture. On power-up, the TAP
controller enters the Test-Logic-Reset state. To guarantee
a reset of the controller from any of the possible states,
TMS must remain high for five TCK cycles. The TRST pin
may also be used to asynchronously place the TAP
controller in the Test-Logic-Reset state.
ProASICPLUS devices support three types of test data
registers: bypass, device identification, and boundary
scan. The bypass register is selected when no other
register needs to be accessed in a device. This speeds up
test data transfer to other devices in a test data path.
The 32-bit device identification register is a shift register
with four fields (lowest significant byte (LSB), ID number,
part number and version). The boundary-scan register
observes and controls the state of each I/O pin.
Each I/O cell has three boundary-scan register cells, each
with a serial-in, serial-out, parallel-in, and parallel-out
pin. The serial pins are used to serially connect all the
boundary-scan register cells in a device into a boundary-
scan register chain, which starts at the TDI pin and ends
at the TDO pin. The parallel ports are connected to the
internal core logic tile and the input, output, and control
ports of an I/O buffer to capture and load data into the
register to control or observe the logic state of each I/O.
Figure 2-10 TAP Controller State Diagram
Test-Logic
Reset
Run-Test/
Idle
Select-DR-
Scan
Capture-DR
Shift-DR
Exit-DR
Pause-DR
Exit2-DR
Update-DR
Select-IR-
Scan
Capture-IR
Shift-IR
Exit-IR
Pause-IR
Exit2-IR
Update-IR
1
0
1
0
00
1
00
1
0
1
0
相關PDF資料
PDF描述
93AA56C-I/P IC EEPROM 2KBIT 3MHZ 8DIP
93C66CT-I/ST IC EEPROM 4KBIT 3MHZ 8TSSOP
93LC56A-E/SN IC EEPROM 2KBIT 3MHZ 8SOIC
EP2S130F1020I4N IC STRATIX II FPGA 130K 1020FBGA
EP4SE530H35C4N IC STRATIX IV FPGA 530K 1152HBGA
相關代理商/技術參數(shù)
參數(shù)描述
APA600-CGS624M 制造商:Microsemi Corporation 功能描述:FPGA ProASICPLUS Family 600K Gates 180MHz 0.22um Technology 2.5V 624-Pin CCGA 制造商:Microsemi Corporation 功能描述:APA600-CGS624M - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 440 I/O 624CCGA
APA600-CQ208B 功能描述:IC FPGA PROASIC+ 600K 208-CQFP RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場可編程門陣列) 系列:ProASICPLUS 標準包裝:1 系列:ProASICPLUS LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計:129024 輸入/輸出數(shù):248 門數(shù):600000 電源電壓:2.3 V ~ 2.7 V 安裝類型:表面貼裝 工作溫度:- 封裝/外殼:352-BFCQFP,帶拉桿 供應商設備封裝:352-CQFP(75x75)
APA600-CQ208M 制造商:Microsemi Corporation 功能描述:FPGA PROASICPLUS 600K GATES 180MHZ 0.22UM 2.5V 208CQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA PROASIC+ 600K 208CQFP 制造商:Microsemi Corporation 功能描述:IC FPGA 158 I/O 208CQFP
APA600-CQ352B 功能描述:IC FPGA PROASIC+ 600K 352-CQFP RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場可編程門陣列) 系列:ProASICPLUS 標準包裝:1 系列:ProASICPLUS LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計:129024 輸入/輸出數(shù):248 門數(shù):600000 電源電壓:2.3 V ~ 2.7 V 安裝類型:表面貼裝 工作溫度:- 封裝/外殼:352-BFCQFP,帶拉桿 供應商設備封裝:352-CQFP(75x75)
APA600-CQ352M 制造商:Microsemi Corporation 功能描述:FPGA PROASICPLUS 600K GATES 180MHZ 0.22UM 2.5V 352CQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 248 I/O 352CQFP