- 您現(xiàn)在的位置：買(mǎi)賣(mài)IC網(wǎng) > PDF目錄1900 > ADUC831BCPZ (Analog Devices Inc)IC MCU 62K FLASH ADC/DAC 56LFCSP PDF資料下載
參數(shù)資料
| 型號(hào)： | ADUC831BCPZ |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 56/76頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC MCU 62K FLASH ADC/DAC 56LFCSP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | MicroConverter® ADuC8xx |
| 核心處理器： | 8052 |
| 芯體尺寸： | 8-位 |
| 速度： | 16MHz |
| 連通性： | EBI/EMI，I²C，SPI，UART/USART |
| 外圍設(shè)備： | PSM，溫度傳感器，WDT |
| 輸入/輸出數(shù)： | 34 |
| 程序存儲(chǔ)器容量： | 62KB（62K x 8） |
| 程序存儲(chǔ)器類(lèi)型： | 閃存 |
| EEPROM 大?。?/td> | 4K x 8 |
| RAM 容量： | 2.25K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 2.7 V ~ 5.5 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 8x12b，D/A 2x12b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 85°C |
| 封裝/外殼： | 56-VFQFN 裸露焊盤(pán)，CSP |
| 包裝： | 托盤(pán) |
| 配用： | EVAL-ADUC831QSZ-ND - KIT DEV FOR ADUC831 QUICK START |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)當(dāng)前第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)
REV. 0
–6–
ADuC831
NOTES
1Temperature Range –40C to +125C.
2ADC linearity is guaranteed during normal Micro Converter core operation.
3ADC LSB Size = V
REF/2
12 i.e., for Internal V
V and for External VREF =1 V, 1 LSB = 244 V.
4These numbers are not production tested but are guaranteed by design and/or characterization data on production release.
5Offset and Gain Error and Offset and Gain Error Match are measured after factory calibration.
6Based on external ADC system components, the user may need to execute a system calibration to remove additional external channel errors and achieve
these specifications.
7SNR calculation includes distortion and noise components.
8Channel-to-channel Crosstalk is measured on adjacent channels.
9The Temperature Monitor will give a measure of the die temperature directly; air temperature can be inferred from this result.
10DAC linearity is calculated using:
Reduced code range of 100 to 4095, 0 to VREF range.
Reduced code range of 100 to 3945, 0 to VDD range.
DAC Output Load = 10 k
and 100 pF.
11DAC differential nonlinearity specified on 0 to V
REF and 0 to VDD ranges
12DAC specification for output impedance in the unbuffered case depends on DAC code.
13DAC specifications for I
SINK, voltage output settling time, and digital-to-analog glitch energy depend on external buffer implementation in unbuffered mode. DAC
in unbuffered mode tested with OP270 external buffer, which has a low input leakage current.
14Measured with V
REF and CREF pins decoupled with 0.1
F capacitors to ground. Power-up time for the internal reference will be determined by the value of the
decoupling capacitor chosen for both the VREF and CREF pins.
15When using an external reference device, the internal band gap reference input can be bypassed by setting the ADCCON1.6 bit. In this mode the V
REF and CREF
pins need to be shorted together for correct operation.
16Flash/EE Memory reliability characteristics apply to both the Flash/EE program memory and the Flash/EE data memory.
17Endurance is qualified to 100,000 cycles as per JEDEC Std. 22 method A117 and measured at -40C, +25C, and +125C. Typical endurance at
25C is 700,000 cycles.
18Retention lifetime equivalent at junction temperature (Tj) = 55C as per JEDEC Std. 22 method A117. Retention lifetime based on an activation energy of 0.6 eV
will derate with junction temperature as shown in Figure 18 in the Flash/EE Memory description section of this data sheet.
19Power supply current consumption is measured in Normal, Idle, and Power-Down Modes under the following conditions:
Normal Mode:
Reset = 0.4 V, Digital I/O pins = open circuit, Core Executing internal software loop.
Idle Mode:
Reset = 0.4 V, Digital I/O pins = open circuit, Core Execution suspended in idle mode.
Power-Down Mode: Reset = 0.4 V, All Port 0 pins = 0.4 V, All other digital I/O pins and Port 1 are open circuit, OSC off, TIC off.
20DV
DD power supply current will increase typically by 3 mA (3 V operation) and 10 mA (5 V operation) during a Flash/EE memory program or erase cycle.
Specifications subject to change without notice.
Parameter
VDD = 5 V
VDD = 3 V
Unit
Test Conditions/Comments
POWER REQUIREMENTS
19, 20
Power Supply Voltages
AVDD/DVDD to AGND
2.7
V min
AVDD /DVDD = 3 V nom
3.3
V max
4.5
V min
AVDD /DVDD = 5 V nom
5.5
V max
Power Supply Currents Normal Mode
DVDD Current
6
3
mA typ
MCLKIN = 1 MHz
AVDD Current
1.7
mA max
MCLKIN = 1 MHz
DVDD Current
25
12
mA max
MCLKIN = 16 MHz
21
10
mA typ
MCLKIN = 16 MHz
AVDD Current
1.7
mA max
MCLKIN = 16 MHz
Power Supply Currents Idle Mode
DVDD Current
5
1
mA typ
MCLKIN = 1 MHz
AVDD Current
0.14
mA typ
MCLKIN = 1 MHz
DVDD Current
4
11
5
mA max
MCLKIN = 16 MHz
10
4
mA typ
MCLKIN = 16 MHz
AVDD Current
0.14
mA typ
MCLKIN = 16 MHz
Power Supply Currents Power Down Mode
MCLKIN = 2 MHz or 16 MHz
AVDD Current
3
2.5
A typ
DVDD Current
35
20
A max
TIMECON.1 = 0
25
12
A typ
160
125
A typ
TIMECON.1 = 1
Typical Additional Power Supply Currents
AVDD = DVDD = 5 V
PSM Peripheral
50
A typ
ADC
1.5
mA typ
DAC
150
A typ
SPECIFICATIONS (continued)
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| ADUC832BSZ-REEL | IC MCU 62K FLASH ADC/DAC 52MQFP |
| ADUC834BCPZ-REEL | IC MCU 62K FLASH ADC/DAC 56LFCSP |
| ADUC836BCPZ | IC MCU 62K FLASH ADC/DAC 56LFCSP |
| ADUC843BSZ62-5 | IC ADC 12BIT W/FLASH MCU 52-MQFP |
| ADUC845BCPZ62-5 | IC FLASH MCU W/24BIT ADC 56-CSP |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ADUC831BCPZ-REEL | 功能描述:IC MCU 62K FLASH ADC/DAC 56LFCSP RoHS:是 類(lèi)別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 標(biāo)準(zhǔn)包裝:38 系列:Encore!® XP® 核心處理器:eZ8 芯體尺寸:8-位 速度:5MHz 連通性:IrDA，UART/USART 外圍設(shè)備:欠壓檢測(cè)/復(fù)位，LED，POR，PWM，WDT 輸入/輸出數(shù):16 程序存儲(chǔ)器容量:4KB（4K x 8） 程序存儲(chǔ)器類(lèi)型:閃存 EEPROM 大小:- RAM 容量:1K x 8 電壓 - 電源 (Vcc/Vdd):2.7 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:- 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 105°C 封裝/外殼:20-SOIC（0.295"，7.50mm 寬） 包裝:管件 其它名稱(chēng):269-4116Z8F0413SH005EG-ND |
| ADUC831BS | 制造商:Analog Devices 功能描述:MCU 8-Bit ADuC8xx 8052 CISC 62KB Flash 3.3V/5V 52-Pin MQFP 制造商:Analog Devices 功能描述:8BIT MCU +12BIT ADC LQFP52 831 |
| ADUC831BS-REEL | 制造商:Analog Devices 功能描述:MCU 8-bit ADuC8xx 8052 CISC 62KB Flash 3.3V/5V 52-Pin MQFP T/R |
| ADUC831BSZ | 功能描述:IC ADC/DAC 12BIT W/MCU 52-MQFP RoHS:是 類(lèi)別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 標(biāo)準(zhǔn)包裝:250 系列:56F8xxx 核心處理器:56800E 芯體尺寸:16-位 速度:60MHz 連通性:CAN，SCI，SPI 外圍設(shè)備:POR，PWM，溫度傳感器，WDT 輸入/輸出數(shù):21 程序存儲(chǔ)器容量:40KB（20K x 16） 程序存儲(chǔ)器類(lèi)型:閃存 EEPROM 大小:- RAM 容量:6K x 16 電壓 - 電源 (Vcc/Vdd):2.25 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:A/D 6x12b 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 125°C 封裝/外殼:48-LQFP 包裝:托盤(pán) 配用:MC56F8323EVME-ND - BOARD EVALUATION MC56F8323 |
| ADUC831BSZ-REEL | 功能描述:IC MCU 62K FLASH ADC/DAC 52MQFP RoHS:是 類(lèi)別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 標(biāo)準(zhǔn)包裝:38 系列:Encore!® XP® 核心處理器:eZ8 芯體尺寸:8-位 速度:5MHz 連通性:IrDA，UART/USART 外圍設(shè)備:欠壓檢測(cè)/復(fù)位，LED，POR，PWM，WDT 輸入/輸出數(shù):16 程序存儲(chǔ)器容量:4KB（4K x 8） 程序存儲(chǔ)器類(lèi)型:閃存 EEPROM 大小:- RAM 容量:1K x 8 電壓 - 電源 (Vcc/Vdd):2.7 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:- 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 105°C 封裝/外殼:20-SOIC（0.295"，7.50mm 寬） 包裝:管件 其它名稱(chēng):269-4116Z8F0413SH005EG-ND |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。